In situ Atomic Force Microscope (in situ AFM)

原位原子力显微镜(原位AFM)将与现有的聚焦离子束扫描电子显微镜(FIB-SEM，蔡司横梁550L)一起用于正在进行和计划中的研究项目以及跨学科和国际研究合作，目的是描述基于微观结构的物理-机械材料行为的机制。对其微观组织性能与变形损伤行为之间的关系进行细致的研究尤为重要。其目的是从所有微观结构层面获得最全面的信息，并将其与机械和技术调查的数据联系起来，并对其进行定性和定量的描述。在操作中，通过机械测试获得的数据特别有价值，这些测试基于加载过程中的物理材料反应，并使用热、电、微磁、光学和声学传感器进行测量。为了将这些物理特性与微观结构联系起来，使用光学和扫描电子显微镜的研究必须通过扫描原子力显微镜来加强。借助AFM原位表征，可以精确测量机械-热-腐蚀载荷下的所有局部形貌、微结构、微机械、电、微磁和腐蚀性能，并将其与操作中确定的材料和部件性能联系起来，以了解工艺-结构-性能之间的关系。结合现有的扫描电子显微镜方法，如EDX和EBSD分析，以及通过FIB-SEM进行3D表征，可以同时和整体地描述微结构元素的性质，这也将用于建模和模拟。作为这一重大知识收获的结果，基于微观结构的材料行为机制将被现场科学地研究，并通过建立精确的变形、损伤和使用寿命模型与宏观性能联系起来。

The in situ Atomic Force Microscope (in situ AFM) will be used in combination with the available Focused Ion Beam Scanning Electron Microscope (FIB-SEM, Zeiss Crossbeam 550L) in ongoing and planned research projects as well as in interdisciplinary and international research cooperations, with the aim to describe the mechanisms of microstructure-based physical-mechanical material behavior. It is of particular importance to undertake meticulous studies on the relationship between microstructure properties, and deformation and damage behavior. The aim is to obtain the most comprehensive information from all microstructural levels and to link it with data from mechanical and technological investigations, and describe it qualitatively and quantitatively. The in operando acquired data from mechanical tests, which are based on physical material reactions during loading and measured using thermal, electrical, micromagnetic, optical and acoustic sensors are particularly valuable. In order to relate these physical characteristics to the microstructure, investigations using light and scanning electron microscopy must be enhanced by scanning atomic force microscopy. With the help of in situ AFM characterization, all the local topographic, microstructural, micromechanical, electrical, micromagnetic and corrosive properties under mechanical-thermal-corrosive loading can be precisely measured and linked with the in operando determined material and component properties for understanding of a process-structure-propertyrelashionship. A combination with available SEM methods such as EDX and EBSD analyses as well as 3D characterization by means of FIB-SEM, allow a simultaneous and holistic property description of microstructural elements, that will also be used for modeling and simulation. As a result of this significant gain in knowledge, the microstructure-based mechanisms of material behavior will be investigated scientifically in situ and linked to the macroscopic properties by creating accurate models of deformation, damage and service life.