Fluorescence Lifetime Imaging Microscope with time-correlated single photon counting

拟议的光谱仪将促进安哈尔特大学最强大的研究科学家小组在太阳能电池和模块的效率提高和可靠性领域进行先进的基于仪器的研究。研究问题涉及材料疲劳、技术开发中的效率损失、生产和光伏元件在真实的操作中的操作。翻译与www.DeepL.com/Translator（免费版）太阳能电池是半导体元件，嵌入聚合物保护层并作为模块进行交易。其目的是实现尽可能高的输出效率，但也要保持至少20年的运行性能。这种长期稳定性目前在现场操作中不能令人满意，而且没有得到充分的研究。在某些情况下，由于老化而导致的年功率损耗是满足保修要求所允许的最大功率损耗的两倍。提出的光谱仪的目标之一是更好地了解复杂的相互作用的半导体和聚合物的性能在降级unter现实的操作条件。科学对提高寿命的贡献是可以实际预期的。所提出的光谱仪可以研究聚合物和半导体降解。样品由不同波长的激光激发，激光通过光纤耦合到显微镜和样品上。信号在同一显微镜中收集，并通过光纤传递到用于时间相关单光子计数的光谱仪或拉曼光谱仪中。通过一台具有可变输出的显微镜组合测量技术，可以在同一位置测量材料。因此，测量不受自然发生的材料变化或不均匀性的影响。选择激光器和探测器以确保相关的波长和测量速度。测量技术的组合允许协同使用，在许多情况下提供无法用单一技术测量的信息。该文书由三个工作组共同申请。主申请人的工作组为小组带来了个人测量技术、计量学、仪器开发和实验室管理方面的经验。工作组的方向是光伏发电量相关的计量和光伏组件的寿命能量预测。WG的领导者是一位国际知名的专家，多年来一直在推动光伏组件可靠性的国际研究发展。他在半导体和聚合物领域都有经验。第二个工作组处理半导体损耗机制及其减少。第三工作组在腐蚀现象和表面涂层方面具有相关经验。所有工作组领导人都是国际领先的科学家。

The proposed spectrometer will facilitate a group of Anhalt University's strongest research scientists to conduct advanced instrumentation-based research in the area of efficiency enhancement and reliability of solar cells and modules. The research questions concern material fatigue, efficiency losses in technology development, production and the operation of photovoltaic elements in real operationTranslated with www.DeepL.com/Translator (free version)Solar cells are semiconductor elements, embedded in polymer protective layers and traded as modules. The aim is to achieve the highest possible output efficiency, but also to maintain this performance for at least 20 years of operation. This long-term stability is currently unsatisfactory in field operation and moreover not sufficiently researched. The annual power loss due to degradation is in some cases twice as high as the maximum allowed to meet warranty requirements. One of the goals of the proposed spectrometer is to better understand the complex interaction of semiconductor and polymer properties during degratation unter realistic operating conditions. Scientific contributions to improved lifetime can realistically be expected. The proposed spectrometer can study both, polymer and semiconductor degradation. The samples are excited by lasers of different wavelengths, which are coupled through optical fibers into a microscope and onto the specimen. The signal is collected in the same microscope and passed via optical fibers into either a spectrometer for time-correlated single photon counting or a Raman spectrograph. The combination of measurement techniques via one microscope with variable outputs allows the materials to be measured at the very same location. Therefore, the measurements are not affected by naturally occurring material variations or inhomogeneities. The lasers and the detectors are chosen to ensure relevant wavelengths and measurement speeds. The combination of measurement techniques allows synergistic use that in many cases gives information that cannot be measured with a single technique. The instrument is jointly applied for by three working groups (WGs). The WG of the lead applicant brings experience in the individual measurement techniques, metrology, instrument development, and laboratory management to the group. The orientation of the WG is PV energy yield related metrology and lifetime energy prediction for PV modules. The WG leader is an internationally renowned expert who has been driving international research development in PV module reliability for years. He has experience in both semiconductor and polymer fields. The second WG deals with semiconductor loss mechanisms and their reduction. The third WG has relevant experience in corrosion phenomena and surface coatings. All WG leaders are internationally leading scientists.