The Evaluation Method of Electromagnetic Disturbance and Interference on Ubiquitous Equipment
The Evaluation Method of Electromagnetic Disturbance and Interference on Ubiquitous Equipment
批准号:
16560253
负责人:
SCHIBUYA Noboru
金额:
$2.3万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2004
资助国家:
日本
项目状态:
已结题
起止时间:
2004 至 2006
中文摘要
近年来,人们对设备内/设备间的电磁干扰问题进行了研究,特别是对普适设备等小型数字设备的电磁干扰问题。设备内干扰是指设备的发射干扰到设备本身的另一部分电路,这种干扰导致设备的性能下降。为了评估电子设备在噪声下的性能退化,为了避免误码率的测量困难,测量了通信性能“吞吐量”。本研究采用近场电磁干扰下的吞吐量来测量性能退化,并将结果与设备发射进行了比较,结果吻合较好。为了建立性能退化的评价方法,对电磁干扰下的通信指标进行了测量。从测量结果中,可以在一定程度上得出近场测量与性能下降的关系。这些事实使我们能够通过测量设备的近场发射来预测PCB上电磁干扰应用下的薄弱区域,反之亦然。为了减少设备内部干扰的风险,无论是电路板上的零件布局,还是设备内电路板的布局,都要做好这方面的管理。应当理解,所述电路具有上述类似的发射和抗扰特性。功能相近的电路最好分开放置,以避免电磁耦合。在进一步的工作中,应明确设备内部干扰产生的机理,并研究减少干扰的技术。
英文摘要
Recently the electromagnetic interference of intra/inter-equipment has been studied, especially on the small digital device such as ubiquitous equipment. The interference of intra-equipment means that an emission form the equipment interferes to another part of circuit on the equipment itself and this interference causes performance degradation of the equipment. To evaluate the performance degradation of the electronic equipment exposed to the noise, the communication performance, "through-put", was measured in avoiding measurement difficulties of BER(bit error rate).In this study, the performance degradation was measured using through-put under near field electromagnetic disturbance, and the results are compared with the emission from equipment, and good agreement was obtained. To develop the evaluation method of the performance degradation, some communication indexes were measured under EM(electromagnetic) disturbance. From the measured results, the relationship between near field measurement and performance degradation could be obtained in some extent. These facts enable us that the weak area under the EM disturbance application on PCB can be foreseen by measuring the near field emission from the equipment and vise versa.To reduce the risk of the intra-equipment interference, the layout of the parts on the circuit board and also the layout of the circuit boards in the equipment should be well managed in this aspect. It is understood that the circuit has similar characteristics of emission and immunity as mentioned above. Circuits having similar function had better to be located apart each other to avoid electromagnetic coupling.In the further work, the mechanism about the interference of intra-equipment should be cleared and the reduction technique for interference should be investigated.
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DOI:
--
发表时间:
2007
期刊:
IEICE Technical report on EMC EMCJ2006-112
影响因子:
--
作者:
[Y.Ohkubo, T.Takahashi, T.Sakusabe, N.Schibuya]
通讯作者:
N.Schibuya
電磁ノイズ干渉によるユビキタス機器の通信性能への影響の測定
测量电磁噪声干扰对无处不在的设备通信性能的影响
DOI:
--
发表时间:
2005
期刊:
エレクトロニクス実装学会 超高速高周波エレクトロニクス実装研究会 4・4
影响因子:
--
作者:
[岡庭弘典, 高橋丈博, 作左部剛視, 渋谷昇]
通讯作者:
渋谷昇
Comparison of near field radiation and performance degradation by electromagnetic disturbance
电磁干扰引起的近场辐射和性能下降的比较
DOI:
--
发表时间:
2007
期刊:
JIEP Proc. of Annual Conf. 15B-11
影响因子:
--
作者:
[Y.Ohkubo, T.Takahashi, T.Sakusabe, N.Schibuya]
通讯作者:
N.Schibuya
DOI:
--
发表时间:
2006
期刊:
JIEE Technical report on Electronic circuits
影响因子:
--
作者:
[Y.Ohkubo, T.Takahashi, T.Sakusabe, N.Schibuya]
通讯作者:
N.Schibuya
電子機器内の近傍放射とノイズ耐力の比較
电子设备附近辐射和噪声耐受度比较
DOI:
--
发表时间:
2007
期刊:
電子情報通信学会 信学技報 EMCJ2006-112
影响因子:
--
作者:
[大久保義和, 高橋丈博, 作左部剛視, 渋谷昇]
通讯作者:
渋谷昇
共 15 条
DEVELOPMENT OF EMC CONSTRAINT DESIGN SUPPORT SYSTEM FOR ELECTRIC AND ELECTORONIC EQUIPMENT
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批准号:10650342
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项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$2.3万
-
财政年份:1998
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负责人:SCHIBUYA Noboru
-
依托单位:
海外基金