Research for Standarization of Evaluation Method of Radiation Effects in Material after Particle Irradiation

在三年的研究中，研究任务主要通过五个工作组的活动来完成。工作组分别为：(1)损伤计算与评估工作组，(2)机器投注工作组，(3)辐照参数测量与评估工作组，(4)力学性能分析与评估工作组，(5)显微组织分析与评估工作组。这项研究的主要目的是建立辐照和辐照后实验的标准技术或方法，供研究辐照效应的工作人员普遍使用。为了符合这一目标，我们采用以下三个任务项目作为实际研究目标；(a)粒子辐照实验硬件系统标准化；(b)粒子辐照后微观结构的样品制备和TEM检测方法标准化；(c)损伤计算方法标准化，并推荐计算机代码。研究结果如下：(i)为符合试验结果，对电子停止参数E-DEP-1和TRIM两种损伤计算计算机规范进行了改进，并提出了新版规范。（ii）建立了离子束测量的硬件规范，如光束强度分布测量。研制了用于粒子辐照实验的试样加热及精密温控系统，并将其作为辐照实验的标准系统。（iii）规范了粒子辐照后透射电镜的标本制备方法，重点是表面切片和背面减薄技术。规范了TEM显微照片的数据采集程序。

For three years of this research, research tasks were performed mainly through the activities of five working groups. Those working groups (W.G.) were as follows, (1)Damage Calculation and Evaluation W.G., (2)Machine betting Up W.G., (3) Irradiation Parameter Measurement and Evaluation W.G., (4)Mechanical Property Analysis and Evaluation W.G., (5)Microstructure Analysis and Evaluation W.G.. The major objective of this research was to establish a standard technique or method of irradiation and post-irradiation experimonts which was commonly available for research workers on ridiation effects. In conformity to this objective we employed follwing three task items as practical research aims; (a) Standarization of hardware systems for particle irradiation experiment, (b) Standarization of sample preparation and TEM inspection method of microstructure after particle irradiation, (c) Standarization of damage calculation method and recommendation of computer code. The results of this research are summarized as follows, (i) Two computer codes for damage calculation, E-DEP-1 and TRIM, were inproved on the electronic stopping parameter in order to conform to experimental results, and the new version of those codes were presented. (ii) Hardware specifications in ion-beam measurements such as beam intensity distribution measurement were established. Specimen heating and precise temperature control system for particle irradiation experiment was developed and employed as standard system in irradiation experiment. (iii) Specimen preparation methods for transmission electron microscopy after particle irradiation were standarized with emphasis on surface sectioning and back thinning techniques. Procedure for data acquisition from TEM photo-micrograph was also standarized.