A Research for High Efficiency X-Ray Spectrometers Using Multilayers

针对高效x射线谱仪，本文介绍了一种利用标准子的新方法。多层结构具有可以自由设计结构的优点。在规则堆积的层之间插入一个间隔，我们就可以做出一个标准子。此外，我们可以通过改变间隔层的厚度来控制标准子的反射率特性。利用合适的标准子，我们可以得到x射线光谱的傅里叶变换信号，并可以用信号的傅里叶反变换重建x射线光谱。通过计算机仿真验证了该方法的有效性。为了获得多层材料的基本数据，我们制作了不同厚度的Ni和C多层材料，并对其反射率进行了评估。我们发现很难制作厚度小于100A的高反射率多层膜，其原因是10A （r.m.s）左右层的粗糙度。在此基础上，我们制备了由Ni和C组成的标准子，并利用特征x射线和同步轨道辐射器对其反射率特性进行了评价。我们发现标准子具有大致设计的特性。我们还开发了一种位置敏感比例计数器，并对其特性进行了评价。我们发现我们的位置敏感比例计数器对5.9 keV x射线具有约2 mm的位置分辨率和18%的能量分辨率。利用我们的位置敏感比例计数器和标准子，可以制作出高效率的x射线光谱仪。

For a high efficiency X-ray spectrometer, we introduced a new method using etalon. Multilayers have a merit which can be freely designed the structure. Inserting a spacer between regularly piled layers, we can make a etalon. Furthermore, we can control the characteristics of the reflectivity of etalon, changing the thickness of the spacer. Using suitable etalons, we can get a fourier transformed signals of the X-ray spectrum and we can reconstruct the X-ray spectrum with inverse fourier transforms of the signals. We showed the validity of this method by a computer simulation.To get a basic data of the multilayers, we fabricated various thickness multilayers consisting of Ni and C, and evaluated the reflectivity. We found that it is difficult to make a high reflectivity multilayers with the thickness of less than 100A and found that its cause is roughness of the layers of about 10A (r.m.s). On the basis of this results, we fabricated etalons consisting Ni and C and evaluated the characteristics of reflectivity using characteristic X-rays and synchrotron orbital radiators. We found that the etalons have a roughly designed characteristics.We also developed a position sensitive proportional counter and evaluated its characteristics. We found that our position sensitive proportional counter has about 2 mm position resolution and 18% energy resolution for 5.9 keV X-rays. It is possible to make a high efficiency X-ray spectrometer using our position sensitive proportional counter and etalons.