X-Ray Study of Fracture Mechanisms of Partially Stabilized Zirconia

1.为了用X射线准确测量陶瓷中的残余应力，确定了氧化锆等工程陶瓷的特征X射线与衍射面的组合。确定了这些衍射面的X射线应力常数.对于氧化锆-氧化铝复合材料，采用X射线法测量了各相的平均应力，并根据混合律计算了宏观应力和微观应力.建立了测量氧化锆中马氏体相变量的X射线方法.对氧化铝、氮化硅和TiC-Cr_3C_2复合材料的预裂纹和缺口试样进行了弯曲试验，并用X射线测量了断口上的残余应力分布。对于氮化硅的情况下，在断裂表面附近测量压缩残余应力。这种压缩与微裂纹引起的膨胀有关.由X射线确定的从表面的非弹性变形的深度与临界应力强度因子的平方成正比。

1. For accurate measurements of residual stresses in ceramics by X-rays, the combination between characteristic X-rays and diffraction plane was determined for zirconia and other engineering ceramics. The X-ray stress constant was determined for these diffraction planes.2. For zirconia-alumina composite, the mean stress in each phase was measured by X- rays, and then the macrostress and microstress were calculated on the basis of rule of mixture.3. The X-ray method to measure the amount of martensitic transformation from tetragonal to monoclinic phase in zirconia was established.4. The bending tests of precracked and notched specimens of alumina, silicon nitride and TiC-Cr_3C_2 composite were conducted, and the distribution of the residual stress on the fracture surface was measured by X-rays. For the case of silicon nitride, the compressive residual stress was measured near the fracture surface. This compression is related to the dilatation due to microcracking.5. The depth of inelastic deformation from the surface determined by X-rays was proportional to the square of the critical stress intensity factor.