X-Ray Residual Stress Measurement and Strength Evaluation of Ceramic Coating
X-Ray Residual Stress Measurement and Strength Evaluation of Ceramic Coating
批准号:
03452103
负责人:
TANAKA Keisuke
金额:
$4.29万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (B)
财政年份:
1991
资助国家:
日本
项目状态:
已结题
起止时间:
1991 至 1992
中文摘要
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英文摘要
1. For alumina detonation coating, the relation between the diffraction angle 2theta and sin^2psi was linear and had no systematic non-linearity. The elastic modulus of coating changed depending on detonation condition and was smaller than that of the bulk solid because of porosity. The residual stress measured was tension and distributed uniformly in the coated film.2. TiC thin films were coated on various substrates by the CVD method. The measured residual stress was slightly more compressive than the residual stress predicted from the difference in the coefficient of thermal expansion (CTE) between coating and substrates. This difference is due to intrinsic stresses.3. The residual stress in TiC-SiC composite films coated on graphite substrates by the CVD method was measured with X-rays by separating overlapped diffraction profiles. The residual stress in the composite film showed a triaxial stress state. The magnitude of the out-of-plane stress sigma_3 was on the same order of the in-plane stresses sigma_1 and sigma_2.4. Fracture toughness of TiC-SiC composite film was measured by the indentation microfracture test. The fracture toughness of composites was much larger than that of monolithic coating because of crack deflection. This deflection was caused by the phase stresses with different signs.5. The texture was highly developed in TiC film coated by the PVD method, and so the conventional sin^2psi method is inapplicable. The 220 plane normal was perpendicular to the film surface.6. A new method for predicting the effect of small defects on the fracture strength of ceramics was pro- posed on the basis of the R-curve method.
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Chihiro Kawai, Kenji Suzuki and Keisuke Tanaka: "Fracture Toughness of TiC-SiC Composites Fabricated by CVD and the Mechanism of Toughening" J. Ceramic Soci. Jpn. 100-6. 835-840 (1992)
Chihiro Kawai、Kenji Suzuki 和 Keisuke Tanaka:“CVD 制造的 TiC-SiC 复合材料的断裂韧性和增韧机制”J. Ceramic Soci。
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通讯作者:
Kenji Suzuki, Keisuke Tanaka and Chihiro Kawai: "Residual Stress of TiC-SiC Composite Film Coated by Chemical Vapor Deposition" Trans. Jpn Soci. Mech. Eng.58-555. 2172-2178 (1992)
Kenji Suzuki、Keisuke Tanaka 和 Chihiro Kawai:“化学气相沉积 TiC-SiC 复合薄膜的残余应力”Trans。
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通讯作者:
田中 啓介: "表面処理層の内部応力" 表面技術. 43. 624-629 (1992)
Keisuke Tanaka:“表面处理层中的内应力”表面技术 43. 624-629 (1992)。
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通讯作者:
鈴木 賢治: "CVD法によるTiC,SiC被覆膜の残留応力測定" 日本材料学会第28回X線材料強度に関する講演会講演論文集. 33-39 (1991)
Kenji Suzuki:“通过 CVD 方法测量 TiC 和 SiC 涂层”第 28 届材料科学学会 X 射线材料强度会议论文集,日本 33-39(1991 年)。
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通讯作者:
Keisuke Tanaka: "X-Ray Measurement of Residual Stress on TiC Coatings by CVD Method" Proceedings of Inter.Symp.Nondestructive Testing and Stress-Strain Measurement. 2. 401-411 (1992)
Keisuke Tanaka:“通过 CVD 方法对 TiC 涂层上的残余应力进行 X 射线测量”Inter.Symp.无损检测和应力应变测量论文集。
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