Establishment of a novel electron tomographic reconstruction method based on a newly found property of image fine dots which convergently move to definitive positions

电子显微镜可以拍摄各种材料的纳米层析图像（纳米级分辨率），其原理与医用x射线CT设备相同。然而，一般来说，因为试样被放置在支撑薄膜上水平延伸，倾斜角度被限制在大约60度（90度）。理想的)。因此，只能得到失真的层析图像。在本研究中，设计了一种新的图像重建方法。将此应用于它们，结果获得了不受畸变伪影影响的成功图像。此外，与一般情况相比，电子剂量降低了约20%。

With an electron microscope nano-tomographic images(nano-order resolution) of various materials can be taken, in which the same principle as medical X-ray CT apparatuses is used. However, in general, because a specimen is put on a support thin film extended horizontally the tilt angle is limited to about 60deg.(90deg. ideal). Therefore, only distorted tomographic images are obtained. In this research work, a novel image reconstruction method was devised. This was applied to them and as a result successful images unaffected by the distortion artifact were obtained. Furthermore, it was achieved that the electron dose was reduced to about 20% as compared with the general case.