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Faster New Materials Optimisation and Discovery: Parallel and Simultaneous HighThroughput Characterisation Using A Novel Multiple Emitter X-Ray Array Source

Faster New Materials Optimisation and Discovery: Parallel and Simultaneous HighThroughput Characterisation Using A Novel Multiple Emitter X-Ray Array Source
更快的新材料优化和发现:使用新型多发射器 X 射线阵列源进行并行、同时高通量表征
批准号:
700662
负责人:
金额:
$1.03万
依托单位:
依托单位国家:
英国
项目类别:
GRD Proof of Market
财政年份:
2016
资助国家:
英国
项目状态:
已结题
起止时间:
2016 至 --

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中文摘要
翻译
Adaptix发明了一种新型平板X射线源(FPS)技术,该技术由多个X射线发射器阵列组成。到目前为止,技术应用主要集中在医学成像的新方法上。这一市场验证(POM)应用程序将探索FPS在材料科学表征方面的商业前景,以实现新材料的优化和发现。材料优化和发现是重大技术和社会进步的核心,例如,能源、电子、清洁技术和可持续性等。基于X射线的分析(例如,X射线衍射、X射线衍射、反射率、XRR、荧光、XRF等)是最广泛使用的第一步非破坏性技术,可以从根本上了解结构组成对功能性能的影响。这些知识是改进材料优化和发现的基石,对申请有效的知识产权保护至关重要。Adaptix将利用其FPS技术的既定经济知识产权优势,并探索在材料表征领域的应用可行性。这是为了通过多个X射线发射器同时和并行表征更快的基于X射线的分析,用于聚合物、采矿、制药、半导体和许多其他行业。这项POM技术拨款申请将允许对整个市场、竞争对手、规格要求进行详细评估,获得原始设备制造商和学术合作伙伴的承诺,以便准确估计资金需求和项目可行性。
英文摘要
Adaptix has invented a novel flat panel X-ray source (FPS) technology that comprises anarray of multiple X-ray emitters. Technology applications have primarily focused on newmethods of medical imaging to date. This Proof-of-Market (PoM) application will explore thecommercial promise of the FPS in materials science characterisation for new materialsoptimisation and discovery. The application follows successful SMART (for core technologydevelopment).Materials optimisation and discovery is at the heart of major technological and socialadvances, e.g.; energy, electronics, clean technology and sustainability etc. X-ray basedanalyses (e.g.; x-ray diffraction, XRD; reflectivity, XRR; fluorescence, XRF etc) are amongstthe most widely used first-step, non-destructive techniques to gain a fundamentalunderstanding of structure-composition influences on functional properties. This knowledge isthe cornerstone of improved material optimisation and discovery and critical for filingeffective IP protection.Adaptix will utilise the established economic IP advantage of its FPS technology and exploreapplication feasibility in the materials characterisation arena. This is for faster x-ray basedanalysis through simultaneous and parallel characterisation via multiple x-ray emitters, for usein industries including polymers, mining, pharmaceuticals, semiconductors and many others.This PoM technology grant application will allow a detailed appraisal of the overall market,competitors, specification requirements, gain commitment from OEMs and academic partnersto allow accurate estimates of funding requirements and project feasibility.
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