Microcantilevers for multifrequency atomic force microscopy

本项目旨在设计一种具有高性能传感器的微悬臂梁，比商用原子力显微镜（afm）中使用的典型光学系统更敏感，噪声性能更好。原子力显微镜（AFM）是一种纳米技术仪器，它使用一个微悬臂（带有一个极具形状的探针）来检测样品表面。它在纳米技术、生命科学、纳米加工、材料科学和数据存储系统方面取得了重要发现。尽管取得了成功，但该技术的空间分辨率和定量测量是有限的。该项目可能会带来突破性的技术，如原子力光谱，以研究纳米结构的弹性模量，并建立澳大利亚在这一新兴领域的突出地位。

This project aims to design a microcantilever with high-performing sensors more sensitive and with better noise performance than the typical optical system used in commercial Atomic Force Microscopes (AFMs). The AFM, a nanotechnology instrument, uses a microcantilever (with an extremely shape probe) to interrogate a sample surface. It has made important discoveries in nanotechnology, life sciences, nanomachining, material science and data storage systems. Despite its success, the technique’s spatial resolution and quantitative measurements are limited. This project could lead to breakthrough technologies such as atomic force spectroscopy to study elastic modulus of nanostructures, and establish Australia's prominence in this emerging field.