Reliable and secure embedded cryptographic systems

尽管安全在手机、汽车、卫星等嵌入式设备中越来越普遍，但仍然存在许多重要的挑战。例如，如何为许多嵌入式系统设计故障保护和可靠的安全是未知的。随着特征尺寸的不断减小，即使在非恶劣环境中，软错误的概率也会增加。芯片封装辐射(在地面应用中)可能会在无意中导致软错误，而软错误的破坏性可能与空间(例如卫星应用)中的辐射轰击引起的单个事件翻转一样严重。由于软错误导致的安全故障的影响可能是毁灭性的，例如由于密钥中的软错误而失去对卫星的控制，或由于有效帐户的身份验证失败而造成的财务损失，或由于汽车中的身份验证失败而导致的个人损失，从而导致刹车失灵。最后，由于可靠性设计通常涉及操作的重复或三倍，它会对旁通道或设备信息的无意泄漏产生影响。总之，迫切需要研究安全设计方法和技术，以有效抵抗和恢复密码模块中的软错误，以确保故障安全和可靠的嵌入式系统的安全实现。本研究方案的目标是解决当前和未来安全嵌入式系统所需的这些重要课题。与以前的方法不同，该研究将利用密码原语中的细粒度功能来支持最优软错误检测，并首次从经验和理论上研究这种软错误减轻对旁信道的影响。此外，还将研究故障保护可信重置技术，重点是在设计系统中使用可信可验证组件。总而言之，这项研究将首次为安全、可靠和故障安全的嵌入式系统建立新的设计方法，这些系统对信息技术和通信行业的未来至关重要。

Although security is increasingly widespread in many embedded devices such as cellphones, automobiles, satellites, etc, there remain many important challenges. For example, it is unknown how to design failsafe and reliable security for many embedded systems. As feature sizes continue to decrease, the probability of a soft error will increase even in non-harsh environments. Soft errors can be induced unintentionally from chip package radiation (in terrestrial applications) and these can be as devastating as a single event upset induced by radiation bombardment in space (such as in satellite applications). Implications for security failures due to a soft error can be devastating such as the loss of control of a satellite due to soft error in a key, or financial loss due to authentication failure of a valid account, or individual loss due to an authentication failure in an automobile causing brakes to fail. Finally, since design for reliability often involves duplication or triplication of operations, it has an impact on the side channel or unintentional leakage of information from the device. In summary there is a great need to research security design methodologies and techniques for efficient resistance to and recovery from soft errors within cryptographic modules to ensure secure implementations of failsafe and reliable embedded systems. The objectives of this research proposal are to tackle these important topics necessary for current and future secure embedded systems. Unlike previous approaches, this proposed research will take advantage of fine grain functionality within the cryptographic primitives to support optimal soft error detection and for the first time, empirically and theoretically, study the impact of this soft error mitigation on the side channel. Additionally failsafe trusted reset techniques focusing on the use of trusted verifiable components within the design system will be researched. In summary, this research will for the first time establish new design methodologies for secure reliable and failsafe embedded systems crucial for the future of information technology and communications industries.