Reliable and secure embedded cryptographic systems

虽然安全性在许多嵌入式设备中越来越普遍，如手机、汽车、卫星等，但仍然存在许多重要的挑战。例如，如何为许多嵌入式系统设计故障安全和可靠的安全性是未知的。随着特征尺寸的不断减小，即使在非恶劣的环境中，软错误的概率也会增加。芯片封装辐射（在地面应用中）可能无意中引起软误差，这些误差可能与空间（如卫星应用中）辐射轰击引起的单一事件扰乱一样具有破坏性。由于软错误而导致的安全故障的影响可能是毁灭性的，例如由于密钥中的软错误而失去对卫星的控制，或者由于有效帐户的身份验证失败而造成的经济损失，或者由于汽车中的身份验证失败导致刹车失灵而造成的个人损失。最后，由于可靠性设计通常涉及重复或三次操作，因此它会对侧通道或设备无意中泄漏的信息产生影响。总之，有必要研究安全设计方法和技术，以有效地抵抗和恢复加密模块中的软错误，以确保故障安全可靠的嵌入式系统的安全实现。本研究计划的目标是解决当前和未来安全嵌入式系统所必需的这些重要主题。与以前的方法不同，本研究将利用加密原语中的细粒度功能来支持最佳的软错误检测，并首次从经验和理论上研究这种软错误缓解对侧信道的影响。此外，将研究在设计系统中使用可信可验证组件的故障安全可信重置技术。总之，这项研究将首次为安全可靠和故障安全的嵌入式系统建立新的设计方法，这对信息技术和通信行业的未来至关重要。

Although security is increasingly widespread in many embedded devices such as cellphones, automobiles, satellites, etc, there remain many important challenges. For example, it is unknown how to design failsafe and reliable security for many embedded systems. As feature sizes continue to decrease, the probability of a soft error will increase even in non-harsh environments. Soft errors can be induced unintentionally from chip package radiation (in terrestrial applications) and these can be as devastating as a single event upset induced by radiation bombardment in space (such as in satellite applications). Implications for security failures due to a soft error can be devastating such as the loss of control of a satellite due to soft error in a key, or financial loss due to authentication failure of a valid account, or individual loss due to an authentication failure in an automobile causing brakes to fail. Finally, since design for reliability often involves duplication or triplication of operations, it has an impact on the side channel or unintentional leakage of information from the device. In summary there is a great need to research security design methodologies and techniques for efficient resistance to and recovery from soft errors within cryptographic modules to ensure secure implementations of failsafe and reliable embedded systems. The objectives of this research proposal are to tackle these important topics necessary for current and future secure embedded systems. Unlike previous approaches, this proposed research will take advantage of fine grain functionality within the cryptographic primitives to support optimal soft error detection and for the first time, empirically and theoretically, study the impact of this soft error mitigation on the side channel. Additionally failsafe trusted reset techniques focusing on the use of trusted verifiable components within the design system will be researched. In summary, this research will for the first time establish new design methodologies for secure reliable and failsafe embedded systems crucial for the future of information technology and communications industries.