Reliable and secure embedded cryptographic systems

虽然安全性在许多嵌入式设备（如手机、汽车、卫星等）中越来越普遍，但仍然存在许多重要的挑战。例如，对于许多嵌入式系统，如何设计故障安全和可靠的安全性是未知的。随着特征尺寸的不断减小，即使在非苛刻的环境中，软错误的概率也会增加。芯片封装辐射（在地面应用中）可能会无意中诱发软错误，并且这些软错误可能与空间辐射轰击（例如在卫星应用中）诱发的单粒子翻转一样具有破坏性。由于软错误导致的安全故障的影响可能是毁灭性的，例如由于密钥中的软错误导致的卫星失去控制，或由于有效帐户的认证失败导致的财务损失，或由于汽车中的认证失败导致制动器失效导致的个人损失。最后，由于可靠性设计通常涉及重复或三次操作，因此会对侧信道或设备的无意信息泄漏产生影响。总之，非常需要研究安全设计方法和技术，以有效地抵抗和恢复密码模块中的软错误，以确保故障安全和可靠的嵌入式系统的安全实现。这项研究计划的目标是解决当前和未来安全嵌入式系统所需的这些重要课题。与以前的方法不同，这项研究将利用加密原语中的细粒度功能来支持最佳软错误检测，并首次从经验和理论上研究这种软错误缓解对侧信道的影响。此外，故障安全可信复位技术，重点是在设计系统中使用可信的可验证组件将进行研究。 总之，这项研究将首次建立新的设计方法，为安全可靠和故障安全的嵌入式系统的信息技术和通信行业的未来至关重要。

Although security is increasingly widespread in many embedded devices such as cellphones, automobiles, satellites, etc, there remain many important challenges. For example, it is unknown how to design failsafe and reliable security for many embedded systems. As feature sizes continue to decrease, the probability of a soft error will increase even in non-harsh environments. Soft errors can be induced unintentionally from chip package radiation (in terrestrial applications) and these can be as devastating as a single event upset induced by radiation bombardment in space (such as in satellite applications). Implications for security failures due to a soft error can be devastating such as the loss of control of a satellite due to soft error in a key, or financial loss due to authentication failure of a valid account, or individual loss due to an authentication failure in an automobile causing brakes to fail. Finally, since design for reliability often involves duplication or triplication of operations, it has an impact on the side channel or unintentional leakage of information from the device. In summary there is a great need to research security design methodologies and techniques for efficient resistance to and recovery from soft errors within cryptographic modules to ensure secure implementations of failsafe and reliable embedded systems. The objectives of this research proposal are to tackle these important topics necessary for current and future secure embedded systems. Unlike previous approaches, this proposed research will take advantage of fine grain functionality within the cryptographic primitives to support optimal soft error detection and for the first time, empirically and theoretically, study the impact of this soft error mitigation on the side channel. Additionally failsafe trusted reset techniques focusing on the use of trusted verifiable components within the design system will be researched. In summary, this research will for the first time establish new design methodologies for secure reliable and failsafe embedded systems crucial for the future of information technology and communications industries.