Atomic Force Microscope for Nanostructured Two-Dimensional Materials and Beyond

原子力显微镜(AFM)是对纳米结构样品表面进行高分辨率成像和在原子水平上研究材料性质的有力工具。它允许以亚纳米分辨率对纳米材料进行三维表征。AFM可以分析各种类型的材料，从纳米结构到薄膜，从二维(2D)材料到块状材料。原子力显微镜是研究低维材料在受控环境下的独特性质与其结构参数之间关系的电子显微镜的重要组成部分。这份申请是为购买新的原子力显微镜系统申请资金，以支持布罗克大学在材料科学、纳米技术、生物物理学和清洁能源技术方面的研究项目。考虑到研究不同类型材料的申请者的研究目标，包括纳米结构2D材料、薄膜、量子材料和生物膜，迫切需要在布罗克建立AFM设施。主要申请者J.Kaur的研究项目是由NSERC发现基金资助的纳米结构2D材料和清洁能源存储技术等新兴领域。她将使用所要求的仪器来研究表面工程2D材料、电解质膜和固态能源设备的电极的结构。共同申请者M.Reedyk将使用该仪器来表征磁性、光学和多功能材料。共同申请者之一，T.Harroun的生物物理学研究项目将利用AFM来研究DNA和蛋白质的结构特性。这些研究计划在过去五年中支持了许多高素质的人员(HQP)，他们有机会在高影响力的期刊和会议出版物上发表成果。此外，布罗克大学数学和科学系的所有成员都可以使用AFM系统。我们希望从牛津仪器庇护研究中心购买MFP-3D Origin+AFM系统，因为与Bruker相比，它提供高分辨率成像，具有全面的成像模式和配件，价格合理。它的高性能和广泛的功能使其成为最合适的选择，可用于各种样品的表征模式(纳米机械、磁性和电化学)，包括软生物材料和硬材料。我们打算每年在该设备上培训15-20名HQP，以实现他们的研究目标。原子力显微镜是材料表征的基础技术。对HQP来说，接受这种乐器的实践培训将是非常有益的，因为这不仅可以提高他们的技术技能，还可以增强他们在工业和学术界的就业能力。牛津仪器公司的MFP-3D Origin+AFM系统对于我们的集体研究计划和及时完成HQP培训至关重要。

Atomic force microscopy (AFM) is a powerful tool for high-resolution imaging of nanostructured sample surfaces and for investigating materials' properties at the atomic level. It allows three-dimensional characterization of nanomaterials with sub-nanometer resolution. Various types of materials can be analyzed by AFM, from nanostructured to thin films and from two-dimensional (2D) materials to bulk materials. AFM plays a key role over electron microscopy, specifically to study how unique properties of low-dimensional materials under controlled environment correlate with their structural parameters. This application is a request for funds for purchasing a new AFM system for supporting research programs in materials science, nanotechnology, biophysics, and clean energy technologies at Brock University. Considering the research objectives of the applicants for studying different types of materials including nanostructured 2D materials, thin films, quantum materials, and biological membranes, it is urgently required to establish AFM facility at Brock. The principal applicant, J. Kaur's research program is in the emerging fields of nanostructured 2D materials and clean energy storage technologies which is funded through an NSERC Discovery grant. She will use the requested instrument to study the structures of surface-engineered 2D materials, electrolyte membranes and electrodes for solid-state energy devices. Co-applicant, M. Reedyk will use this instrument to characterize magnetic, optical, and multifunctional materials. Co-applicant, T. Harroun's biophysics research program would utilize the AFM to study structural properties of DNA and proteins. These research programs have supported numerous highly qualified personnel (HQP) in the last five years who have had the opportunity to publish results in high impact journals and conference publications. In addition, the AFM system will be accessible to all the members of the Faculty of Mathematics and Science at Brock University. We wish to purchase the MFP-3D Origin+ AFM system from Oxford Instruments Asylum Research because it offers high-resolution imaging with a full range of imaging modes and accessories at affordable price, as compared to Bruker. Its high performance and extensive capabilities allow a range of characterization modes (nanomechanical, magnetic and electrochemical) for a wide variety of samples, including soft biological materials and hard materials which makes it the most suitable choice. We intend to train 15-20 HQP each year on this equipment for pursuing their research goals. AFM is a foundational technique for materials characterization. It will be highly beneficial for HQP to get hands-on training on this instrument as it will not only advance their technical skills but also enhance their employability in industry and academia. The MFP-3D Origin+ AFM system from Oxford Instruments is essential for our collective research programs and for the timely completion of HQP training.