Polytypism of SiC and interfacial structure in SiCp/Al composites

Polytypism of SiC and interfacial structure in SiCp/Al composites
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SiCp/Al复合材料中SiC的多型性和界面结构

DOI:
10.1023/a:1021027731189
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发表时间:
2002-12
期刊:
Journal of Materials Sciences
影响因子:
--
通讯作者:
Renjie Wu
Renjie Wu
中科院分区:
其他
文献类型:
--
作者:
Tongxiang Fan;Di Zhang;Renjie Wu

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利用x射线衍射仪(XRD)和高分辨透射电镜(HREM)研究了SiC的多型性和SiC与Al的界面结构。结果表明,在同一SiC增强层中,15R可以与6H叠加序列并置,并观察到结构转变区。Al4C3化合物可在SiC/Al界面上成核,生长方向平行于SiC的C轴。并对观测到的现象的机理进行了详细的讨论。
In the present work, the polytypism of SiC and the interfacial structure between SiC and Al were investigated using X-ray diffraction (XRD) and high resolution transmission electron microscopy (HREM). It was approved that 15R could be juxtaposed with 6H stacking sequences in the same SiC reinforcement and a structural transformation zone was also observed. The Al4C3 compound can nucleate on SiC at the SiC/Al interface with the growth orientation parallel to the C axis of SiC. Mechanisms for the observed phenomena were also discussed in detail.
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