Comparison of EBSD patterns simulated by two multislice methods

Comparison of EBSD patterns simulated by two multislice methods
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两种多层方法模拟的 EBSD 图案比较

DOI:
10.1111/jmi.12418
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发表时间:
2016-10
影响因子:
2
通讯作者:
Wang, Y. G.
Wang, Y. G.
中科院分区:
工程技术4区
文献类型:
--
作者:
Liu, Q. B.;Cai, C. Y.;Zhou, G. W.;Wang, Y. G.

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基于动态电子衍射理论的衍射模拟可以促进从电子背散射衍射(EBSD)图案中提取晶体学信息。在这项工作中,EBSD图案成功地模拟了两个多层方法,即真实的空间(RS)方法和修正的真实的空间(RRS)方法。对不同加速电压、Debye-Waller因子和孔径半径下的计算结果进行了详细的比较和分析。结果表明,在相同的计算条件下,RRS方法比RS方法提供了更大的EBSD图的视场。此外,RRS方法得到的EBSD图谱的菊池谱带与实验图谱的匹配度优于RS方法。特别是RRS方法得到的晶格参数比RS方法得到的晶格参数更精确。这些结果表明,在可接受的计算时间内,RRS方法比RS方法更准确地模拟EBSD图案。
The extraction of crystallography information from electron backscatter diffraction (EBSD) patterns can be facilitated by diffraction simulations based on the dynamical electron diffraction theory. In this work, the EBSD patterns are successfully simulated by two multislice methods, that is, the real space (RS) method and the revised real space (RRS) method. The calculation results by the two multislice methods are compared and analyzed in detail with respect to different accelerating voltages, Debye–Waller factors and aperture radii. It is found that the RRS method provides a larger view field of the EBSD patterns than that by the RS method under the same calculation conditions. Moreover, the Kikuchi bands of the EBSD patterns obtained by the RRS method have a better match with the experimental patterns than those by the RS method. Especially, the lattice parameters obtained by the RRS method are more accurate than those by the RS method. These results demonstrate that the RRS method is more accurate for simulating the EBSD patterns than the RS method within the accepted computation time.
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