Electric field enhancement in ceramic capacitors due to interface amplitude roughness
Electric field enhancement in ceramic capacitors due to interface amplitude roughness
复制标题
由于界面振幅粗糙度导致陶瓷电容器中的电场增强
DOI：
10.1016/j.jeurceramsoc.2018.10.033
复制
发表时间：
2019
影响因子：
5.7
通讯作者：
Heath J
中科院分区：
文献类型：
--
作者：
Heath J
本文用有限元模拟方法研究了多层陶瓷电容器中陶瓷层与电极层界面的电学行为。根据内部和文献中捕获的显微照片分析，制作了具有不同粗糙度幅度的界面模型。比较了不同界面的阻抗响应、直流电场和电流密度分布。将均方根振幅粗糙度从0增加到0.16 μm，最大场强增加了4倍以上。电场分布表明，电场强度增加的波动是由于局部界面形态。尖锐的电极侵入陶瓷层导致特别大的场增强，应避免以减少器件击穿的可能性。
The electrical behaviour of the interface between the ceramic and electrode layers in multi layer ceramic capacitors has been studied using finite element modelling. Interface models were produced with varying amplitudes of roughness based upon analysis of micrographs both captured in-house and from the literature. The impedance responses, direct current electric field and current density distributions of the different interfaces were compared. Increasing the root-mean-squared amplitude roughness from 0 to 0.16 μm increased the maximum field strength by over a factor of four. The electric field distribution showed that fluctuations in the increase of field strength were due to local interface morphology. Sharp intrusions of the electrode into the ceramic layer resulted in particularly large field enhancements and should be avoided to reduce the likelihood of device breakdown.
登录
查看更多内容
影响因子：
3.9
作者：
J. Dean;J. Harding;D. Sinclair
通讯作者：
J. Dean;J. Harding;D. Sinclair
DOI：
10.1002/nme.2579
发表时间：
2009-09-10
影响因子：
2.9
作者：
Geuzaine, Christophe;Remacle, Jean-Francois
通讯作者：
Remacle, Jean-Francois
多层陶瓷电容器中贱金属电极层的缺陷
影响因子：
3.9
作者：
Bang;Wen
通讯作者：
Wen
共烧多层陶瓷电容器端接陶瓷添加的研究
影响因子：
4.6
作者：
Ying;C. Lee;Stanley Wang;F. Shieu
通讯作者：
F. Shieu
影响因子：
3.9
作者：
Heath, James P.;Dean, Julian S.;Sinclair, Derek C.
通讯作者：
Sinclair, Derek C.