Association between tDCS computational modeling and clinical outcomes in depression: data from the ELECT-TDCS trial.
Association between tDCS computational modeling and clinical outcomes in depression: data from the ELECT-TDCS trial.
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经颅直流电刺激（tDCS）计算模型与抑郁症临床结果之间的关联：来自ELECT - TDCS试验的数据
DOI：
10.1007/s00406-020-01127-w
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发表时间：
2021-03
影响因子：
4.7
通讯作者：
Brunoni AR
中科院分区：
文献类型：
--
作者：
Suen PJC;Doll S;Batistuzzo MC;Busatto G;Razza LB;Padberg F;Mezger E;Bulubas L;Keeser D;Deng ZD;Brunoni AR
经颅直流电刺激（tDCS）是一种非侵入性脑刺激干预，用于治疗抑郁症。临床结果是不均匀的，部分原因是由于头部解剖结构的个体差异导致大脑中电场（EF）强度的变化。因此，我们研究了EF强度是否与行为变化在16例抑郁症患者使用模拟电场在真实的患者数据从对照临床试验。我们假设背外侧前额叶皮层（DLPFC）和前扣带皮层（ACC）的EF强度与抑郁症病理生理学有关的大脑区域，将与抑郁症，情绪和焦虑评分的变化相关。SimNIBS被用来模拟基于抑郁症受试者的MRI结构T1加权脑扫描的个体电场。线性回归模型显示，在急性治疗期结束时，模拟EF强度与双侧ACC中的负面影响呈负相关（左：β = − 160.463，CI [− 291.541，− 29.385]，p = 0.021;右：β = − 189.194，CI [− 289.479，− 88.910]，p = 0.001）和DLPFC（左：β = − 93.210，CI [− 154.960，− 31.461]，p = 0.006;右：β = − 82.564，CI [− 142.867，− 22.262]，p = 0.011）和左侧前扣带回抑郁评分（β = − 156.91，CI [− 298.51，− 15.30]，p = 0.033）。未发现积极情感或焦虑评分与所研究大脑区域的模拟EF强度之间存在关联。总而言之，我们的研究结果表明，初步证据表明EF强度模拟可能与抑郁症患者的进一步行为变化有关，揭示了tDCS的潜在作用机制。进一步的研究应调查关键脑区EF强度的个体化是否会影响临床反应。
Transcranial direct current stimulation (tDCS) is a non-invasive brain stimulation intervention investigated for the treatment of depression. Clinical results have been heterogeneous, partly due to the variability of electric field (EF) strength in the brain owing to interindividual differences in head anatomy. Therefore, we investigated whether EF strength was correlated with behavioral changes in 16 depressed patients using simulated electric fields in real patient data from a controlled clinical trial. We hypothesized that EF strength in the dorsolateral prefrontal cortex (DLPFC) and anterior cingulate cortex (ACC), brain regions implicated in depression pathophysiology, would be associated with changes in depression, mood and anxiety scores. SimNIBS were used to simulate individual electric fields based on the MRI structural T1-weighted brain scans of depressed subjects. Linear regression models showed, at the end of the acute treatment phase, that simulated EF strength was inversely associated with negative affect in the bilateral ACC (left: β = − 160.463, CI [− 291.541, − 29.385], p = 0.021; right: β = − 189.194, CI [− 289.479, − 88.910], p = 0.001) and DLPFC (left: β = − 93.210, CI [− 154.960, − 31.461], p = 0.006; right: β = − 82.564, CI [− 142.867, − 22.262], p = 0.011) and with depression scores in the left ACC (β = − 156.91, CI [− 298.51, − 15.30], p = 0.033). No association between positive affect or anxiety scores, and simulated EF strength in the investigated brain regions was found. To conclude, our findings show preliminary evidence that EF strength simulations might be associated with further behavioral changes in depressed patients, unveiling a potential mechanism of action for tDCS. Further studies should investigate whether individualization of EF strength in key brain regions impact clinical response.
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影响因子：
7.7
作者：
Brunoni, Andre Russowsky;Nitsche, Michael A.;Bolognini, Nadia;Bikson, Marom;Wagner, Tim;Merabet, Lotfi;Edwards, Dylan J.;Valero-Cabre, Antoni;Rotenberg, Alexander;Pascual-Leone, Alvaro;Ferrucci, Roberta;Priori, Alberto;Boggio, Paulo Sergio;Fregni, Felipe
通讯作者：
Fregni, Felipe
影响因子：
7.7
作者：
Bikson M;Brunoni AR;Charvet LE;Clark VP;Cohen LG;Deng ZD;Dmochowski J;Edwards DJ;Frohlich F;Kappenman ES;Lim KO;Loo C;Mantovani A;McMullen DP;Parra LC;Pearson M;Richardson JD;Rumsey JM;Sehatpour P;Sommers D;Unal G;Wassermann EM;Woods AJ;Lisanby SH
通讯作者：
Lisanby SH
人脑网络组图谱：基于连接架构的新大脑图谱
DOI：
10.1093/cercor/bhw157
发表时间：
2016-08
期刊：
Cerebral cortex (New York, N.Y. : 1991)
影响因子：
--
作者：
Fan L;Li H;Zhuo J;Zhang Y;Wang J;Chen L;Yang Z;Chu C;Xie S;Laird AR;Fox PT;Eickhoff SB;Yu C;Jiang T
通讯作者：
Jiang T
影响因子：
25
作者：
Chikazoe, Junichi;Lee, Daniel H.;Kriegeskorte, Nikolaus;Anderson, Adam K.
通讯作者：
Anderson, Adam K.
负面情绪调节期间额叶皮层活性增加，这是6个月内抑郁症状严重程度轨迹的预测指标。
影响因子：
25.8
作者：
Heller, Aaron S.;Johnstone, Tom;Peterson, Michael J.;Kolden, Gregory G.;Kalin, Ned H.;Davidson, Richard J.
通讯作者：
Davidson, Richard J.