Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry
Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry
复制标题
电子散斑干涉测量中仅使用两种散斑图的空间条纹分析方法测量精度的提高
DOI：
10.1117/1.oe.53.3.034107
复制
发表时间：
2014
影响因子：
1.3
通讯作者：
Y. Arai
中科院分区：
文献类型：
--
作者：
Y. Arai
抽象。提出了一种基于散斑图的条纹分析方法，利用电子散斑干涉中的两幅散斑图实现高分辨率变形测量。在条纹分析中，使用所提出的光学系统，一对真实的-和非线性部分的成分有关的变形信息是提取从一个散斑图案傅立叶变换以同样的方式离轴数字全息处理。通过将散斑图案的真实的和虚部的分量相乘来计算散斑图作为条纹图像，以便执行高分辨率变形分析。然后从散斑图中提取出与变形有关的相位图，并通过频域平移分量来降低散斑噪声的影响。此外，对散斑图强度分布的幅值进行归一化处理，进一步减小了散斑噪声的影响。实验结果表明，所提出的降噪方法有效地提高了变形测量的精度。
Abstract. High-resolution deformation measurement method, which requires only two speckle patterns in electronic speckle pattern interferometry, is proposed by using fringe analysis based on specklegram. In fringe analysis using the proposed optical system, a pair of real- and imaginary-part components concerning the deformation information is extracted from one speckle pattern by Fourier transform in the same manner as the off-axis digital holography processing. A specklegram is calculated as a fringe image by multiplying the components of the real and imaginary part of speckle patterns in order to perform a high-resolution deformation analysis. Then, the phase map concerning deformation is detected from the specklegram, and the influence of speckle noise is also reduced by shifting the component on frequency domain. Furthermore, the amplitude of the intensity distribution of speckle pattern is normalized in order to reduce the influence by speckle noise much more. It is confirmed that the accuracy of the deformation measurement is efficiently improved by the proposed noise reduction methods.
影响因子：
1.3
作者：
Y. Arai;Hiroyuki Hira;S. Yokozeki
通讯作者：
Y. Arai;Hiroyuki Hira;S. Yokozeki
基于空间条纹分析metgid的电散斑干涉测量面内位移
DOI：
--
发表时间：
2004
期刊：
Optical Engineering Vol.43, No.9
影响因子：
--
作者：
Y.Arai;S.Yokozeki
通讯作者：
S.Yokozeki