Electrodeposited tungsten oxide films onto porous silicon for NO 2 detection at room temperature

Electrodeposited tungsten oxide films onto porous silicon for NO 2 detection at room temperature
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多孔硅上电沉积氧化钨薄膜用于室温 NO 2 检测

DOI:
10.1016/j.jallcom.2017.11.175
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发表时间:
2018-02
影响因子:
6.2
通讯作者:
Meng Cao
Meng Cao
中科院分区:
材料科学2区
文献类型:
--
作者:
Dali Yan;Shenyu Li;Shiyu Liu;Ming Tan;Meng Cao

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在多孔硅(PS)表面电化学沉积氧化钨薄膜,然后在空气中退火,制备了氧化钨薄膜/多孔硅(WO 3/PS)复合材料。采用扫描电镜(SEM)、X射线衍射(XRD)和拉曼光谱(RS)对产物进行了表征。研究了WO 3/PS复合材料在室温(RT,125 °C)~ 200 °C范围内对NO2的气敏性能。结果表明,所有的WO 3/PS气敏元件均表现出典型的p型半导体特性,并存在一个最佳的工作温度RT。与PS相比,适当沉积的WO 3/PS复合材料在RT下具有更高的气体响应、更短的响应恢复时间、良好的重复性和对NO2气体的选择性,这可能与其异质结效应和独特的微结构特性有关。此外,本文还对可能的NO2敏感机理进行了探讨。
Here we prepare a composite of tungsten oxide films/porous silicon (WO3/PS) hybrid structure synthesized by electrochemical deposition of WO3films onto p-type PS with subsequent annealing process in air. The obtained WO3/PS products were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD) and Raman spectroscopy (RS). The gas-sensing properties of WO3/PS composite to NO2ranging from room temperature (RT, ∼25 °C) to 200 °C were studied. The result indicated that all the WO3/PS gas sensors showed typical p-type semiconductor behavior and had an optimal working temperature of RT. Furthermore, compared with PS, the proper deposited WO3/PS composite exhibited a higher gas response, shorter response-recovery time, good repeatability and selectivity toward NO2gas at RT. This improvement probably owing to the heterojunction effect and its unique microstructure properties. In addition, the possible NO2-sensing mechanisms were also discussed in this paper.
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