Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics.
Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics.
复制标题
DOI：
10.1016/j.jsb.2013.08.008
复制
发表时间：
2013-11
影响因子：
3
通讯作者：
Striemer, Christopher
中科院分区：
文献类型：
--
作者：
Marko, Michael;Meng, Xing;Hsieh, Chyongere;Roussie, James;Striemer, Christopher
Zernike相位板成像越来越多地用于低温TEM断层扫描和低温EM单粒子应用。然而，相位板的快速老化，以及生产它们的成本和努力，严重阻碍了广泛采用。我们正在试验基于具有薄窗口的硅芯片的相位板;这种相位板可以大规模生产，并且以适度的成本提供。窗口涂有导电层以减少充电，与传统的纯碳相板相比，这大大延长了相板的使用寿命。然而，必须在鲁棒性和通过相位板膜的透射率之间达成折衷。详细介绍了通过对非晶薄膜成像和评估图像的功率谱来测试相位板性能的方法。
Imaging with Zernike phase plates is increasingly being used in cryo-TEM tomography and cryo-EM single-particle applications. However, rapid ageing of the phase plates, together with the cost and effort in producing them, present serious obstacles to widespread adoption. We are experimenting with phase plates based on silicon chips that have thin windows; such phase plates could be mass-produced and made available at moderate cost. The windows are coated with conductive layers to reduce charging, and this considerably extends the useful life of the phase plates compared to traditional pure-carbon phase plates. However, a compromise must be reached between robustness and transmission through the phase-plate film. Details are given on testing phase-plate performance by means of imaging an amorphous thin film and evaluating the power spectra of the images.
登录
查看更多内容
影响因子：
5.7
作者：
Murata, Kazuyoshi;Liu, Xiangan;Chiu, Wah
通讯作者：
Chiu, Wah
影响因子：
3
作者：
Danev, Radostin;Nagayama, Kuniaki
通讯作者：
Nagayama, Kuniaki
影响因子：
3
作者：
Marko, Michael;Leith, ArDean;Danev, Radostin
通讯作者：
Danev, Radostin
影响因子：
2.2
作者：
Edgcombe, C. J.;Ionescu, A.;Barnes, C. H. W.
通讯作者：
Barnes, C. H. W.
影响因子：
2.2
作者：
Cambie, Rossana;Downing, Kenneth H.;Jin, Jian
通讯作者：
Jin, Jian