A Highly Sensitive Optical Sensor Design by Integrating a Circular-Hole Defect With an Etched Diffraction Grating Spectrometer on an Amorphous-Silicon Photonic Chip
A Highly Sensitive Optical Sensor Design by Integrating a Circular-Hole Defect With an Etched Diffraction Grating Spectrometer on an Amorphous-Silicon Photonic Chip
复制标题
在非晶硅光子芯片上集成圆孔缺陷和蚀刻衍射光栅光谱仪的高灵敏度光学传感器设计
DOI:
10.1109/jphot.2012.2188097
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发表时间:
2012-02
影响因子:
2.4
通讯作者:
Li, X.
中科院分区:
文献类型:
--
作者:
Song, J.;Li, Y. Z.;Zhou, X.;Li, X.
We present a sensitive optical sensor design by integrating a circular-hole defect with an etched diffraction grating (EDG) spectrometer based on amorphous-silicon photonic platforms. The circular-hole defect obtained from the outdiffusion of the hydrogen in the annealing process can induce strong resonant scattering loss at some special wavelengths. The positions of resonant peaks will linearly shift with the refractive index change of the detected sample (the sensitivity is 9200 nm/RIU). In addition, the influences of the defect on the sensing characteristics are numerically analyzed based on a scalar diffraction method and a Green tensor technology.
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影响因子:
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