Low current consuming thermally stable sulphide phase change memory

Low current consuming thermally stable sulphide phase change memory
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低电流消耗热稳定硫化物相变存储器

DOI:
10.1007/s10854-015-3089-x
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发表时间:
2015
期刊:
Materials in Electronics
影响因子:
--
通讯作者:
Gholipour B
Gholipour B
中科院分区:
--
文献类型:
--
作者:
Gholipour B

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我们发现,基于镓和镧硫化物的相变介质在热稳定性和功耗两个关键指标上可以超过众所周知的基准性能。通过相同的纳米级硫化镓和碲化锑锗器件的制备和表征,我们发现前者具有较低的电流消耗,同时仍然表现出较高的两相电阻和较高的相间电阻对比度,可与等效的碲化锗锑器件相媲美。我们还证明,这些基于硫化物的设备继续显示出可测量的阈值,并在500°C以上的温度下保留信息,远远超过传统的基于碲化物的设备。
We show that phase change media based on the gallium and lanthanum chalcogenides can outperform the well know benchmark performance of germanium antimony telluride devices in two key specifications thermal stability and power consumption. Through the fabrication and characterisation of identical nanoscale gallium lanthanum sulphide and germanium antimony telluride based devices, we show that the former compounds offer lower current consumption, while still exhibiting a relatively high resistance in both phases and high resistance contrast between phases, comparable to an equivalent germanium antimony telluride device. We also demonstrate that these sulphide-based devices continue to display a measurable threshold and retain information at temperatures above 500 °C, considerably outperforming conventional telluride based devices.
使用 Ge 掺杂 SbTe 提高相变存储器件在不同环境温度下的稳定性
DOI: --
发表时间: 2010
期刊:
影响因子: --
作者:
Zhe Wu;Suyoun Lee;Y. Park;H. Ahn;D. Jeong;J. Jeong;K. No;B. Cheong
通讯作者: B. Cheong
硫族化物的缺陷和阈值转换
DOI: --
发表时间: 1992
期刊:
影响因子: --
作者:
W. Herms
通讯作者: W. Herms