Image formation simulation for computer-aided inspection planning of machine vision systems

Image formation simulation for computer-aided inspection planning of machine vision systems
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用于机器视觉系统计算机辅助检测规划的图像形成模拟

DOI:
10.1117/12.2269166
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发表时间:
2017
期刊:
影响因子:
--
通讯作者:
Wörn H.
Wörn H.
中科院分区:
--
文献类型:
--
作者:
Irgenfried S;Bergmann S;Mohammadikaji M;Beyerer J;Dachsbacher C;Wörn H.

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在这项工作中,计算机辅助检测规划(CAIP)的自动光学检测(AOI)系统的仿真工具集,提出了沿着与一个通用的两个机器人设置验证仿真和系统规划的结果。该工具集有助于缩小与系统专家交互的光学检测系统的大设计空间。采用基于GPU的真实的实时图形和高质量的离线绘制技术对光学检测系统中的成像过程进行了模拟。仿真流水线允许逐步优化系统,从基于真实的时间图形的表面块可见性的快速评估到基于离线全局照明计算的图像处理结果的评估。这项工作的一个重点是依赖于测量,建模和参数化的光学表面特性的对象被检查的仿真质量。以规划三维激光扫描仪应用为例,证明了该方法对真实的世界问题的适用性。定性和定量的比较结果的合成和真实的图像。
In this work, a simulation toolset for Computer Aided Inspection Planning (CAIP) of systems for automated optical inspection (AOI) is presented along with a versatile two-robot-setup for verification of simulation and system planning results. The toolset helps to narrow down the large design space of optical inspection systems in interaction with a system expert. The image formation taking place in optical inspection systems is simulated using GPU-based real time graphics and high quality off-line-rendering. The simulation pipeline allows a stepwise optimization of the system, from fast evaluation of surface patch visibility based on real time graphics up to evaluation of image processing results based on off-line global illumination calculation. A focus of this work is on the dependency of simulation quality on measuring, modeling and parameterizing the optical surface properties of the object to be inspected. The applicability to real world problems is demonstrated by taking the example of planning a 3D laser scanner application. Qualitative and quantitative comparison results of synthetic and real images are presented.
将高斯光束属性和散斑集成到基于物理的渲染器中的唯象方法
DOI: 10.2312/vmv.20161357
发表时间: 2016
期刊:
影响因子: --
作者:
Bergmann S;Mohammadikaji M;Irgenfried S;Wörn H;Beyerer J;Dachsbacher C.
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发表时间: 2017
期刊: 2017 IEEE Winter Conference on Applications of Computer Vision (WACV)
影响因子: --
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期刊: 2009 35th Annual Conference of IEEE Industrial Electronics
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DOI: --
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