High-Throughput Logic Timing Simulation on GPGPUs
High-Throughput Logic Timing Simulation on GPGPUs
复制标题
GPGPU 上的高吞吐量逻辑时序仿真
DOI:
10.1145/2714564
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发表时间:
2015
期刊:
影响因子:
--
通讯作者:
Hans-Joachim Wunderlich
中科院分区:
文献类型:
--
作者:
Stefan Holst;Michael E. Imhof;Hans-Joachim Wunderlich
Many EDA tasks such as test set characterization or the precise estimation of power consumption, power droop and temperature development, require a very large number of time-aware gate-level logic simulations. Until now, such characterizations have been feasible only for rather small designs or with reduced precision due to the high computational demands.The new simulation system presented here is able to accelerate such tasks by more than two orders of magnitude and provides for the first time fast and comprehensive timing simulations for industrial-sized designs. Hazards, pulse-filtering, and pin-to-pin delay are supported for the first time in a GPGPU accelerated simulator, and the system can easily be extended to even more realistic delay models and further applications.A sophisticated mapping with efficient memory utilization and access patterns as well as minimal synchronizations and control flow divergence is able to use the full potential of GPGPU architectures. To provide such a mapping, we combine for the first time the versatility of event-based timing simulation and multi-dimensional parallelism used in GPU-based gate-level simulators. The result is a throughput-optimized timing simulation algorithm, which runs many simulation instances in parallel and at the same time fully exploits gate-parallelism within the circuit.
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DOI:
10.1109/ats.2012.23
发表时间:
2012
期刊:
2012 IEEE 21st Asian Test Symposium
影响因子:
--
作者:
S. Holst;E. Schneider;H. Wunderlich
通讯作者:
H. Wunderlich
DOI:
--
发表时间:
2010
期刊:
2010 IEEE International Test Conference
影响因子:
--
作者:
Huawei Li;Dawen Xu;Yinhe Han;K. Cheng;Xiaowei Li
通讯作者:
Xiaowei Li
DOI:
--
发表时间:
2010
期刊:
Design Automation Conference
影响因子:
--
作者:
M. Kochte;M. Schaal;H. Wunderlich;Christian G. Zoellin
通讯作者:
Christian G. Zoellin
DOI:
--
发表时间:
2010
期刊:
Journal of electronic testing
影响因子:
--
作者:
Kanupriya Gulati;S. Khatri
通讯作者:
S. Khatri
DOI:
--
发表时间:
1996
期刊:
Proceedings of 9th International Conference on VLSI Design
影响因子:
--
作者:
Y. Min;Zhuxing Zhao;Zhongcheng Li
通讯作者:
Zhongcheng Li