The Influence of Cu on Metastable NiSn4 in Sn-3.5Ag-xCu/ENIG Joints
The Influence of Cu on Metastable NiSn4 in Sn-3.5Ag-xCu/ENIG Joints
复制标题
Cu 对 Sn-3.5Ag-xCu/ENIG 接头中亚稳态 NiSn4 的影响
DOI:
10.1007/s11664-015-3964-5
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发表时间:
2015
影响因子:
2.1
通讯作者:
Belyakov S
中科院分区:
文献类型:
--
作者:
Belyakov S
We have investigated the effect of small amounts of Cu on suppression of metastableβSn-NiSn4eutectic growth in solder joints between Sn-3.5Ag-xCu solders and Ni-based substrates. For Sn-3.5Ag/electroless nickel immersion gold (ENIG) and Sn-3.5Ag/Ni solder joints we showed that the eutectic mixture containsβSn, Ag3Sn, and metastable NiSn4. It was found that addition of only 0.005 wt.% Cu to Sn-3.5Ag-xCu/ENIG or Sn-3.5Ag-xCu/Ni joints promoted formation of a stableβSn-Ni3Sn4eutectic and that both Ni3Sn4and NiSn4occur in the eutectic at this Cu level. We also showed that for complete prevention of formation of metastable NiSn4during eutectic solidification of the solder joint, addition of at least 0.3 wt.% Cu was required.
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