Comparison of Bi(1), Bi(3) and C(60) primary ion sources for ToF-SIMS imaging of patterned protein samples.
Comparison of Bi(1), Bi(3) and C(60) primary ion sources for ToF-SIMS imaging of patterned protein samples.
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DOI：
10.1002/sia.3537
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发表时间：
2011-01
影响因子：
1.7
通讯作者：
Castner, David G.
中科院分区：
文献类型：
--
作者：
Dubey, Manish;Brison, Jeremy;Grainger, David W.;Castner, David G.
成像飞行时间二次离子质谱（ToF-SIMS）已被用于研究结合在光刻图像化的商业聚乙二醇（PEG）基聚合物薄膜上的蛋白质。从特征蛋白片段的表面灵敏度和离子图像的对比度方面分析了不同离子源对该样品破碎模式的影响。该方法表明，与Bi1+和C60+簇源相比，在相似的通量（低于静态极限）下，Bi3+对低质量碎片具有更好的表面灵敏度和最佳的图像对比度。主成分分析（PCA）用于处理该样品的深度剖面，结果表明，通过吸附的蛋白质层蚀刻需要大约20 × 1012个离子/cm2的主离子影响。
Imaging time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to study protein bound to a photolithographically-patterned, commercial poly(ethylene glycol) (PEG)-based polymer film. The effect of different ion sources on the fragmentation pattern from this sample was analyzed with respect to the surface sensitivity of characteristic protein fragments and contrast in the ion images. The method demonstrates that, under similar fluence (below the static limit), Bi3+ provides better surface sensitivity for low mass fragments and the best image contrast as compared to Bi1+ and C60+ cluster sources. Principal component analysis (PCA) was utilized to process depth profiles for this sample and shows that a primary ion fluence of approximately 20 × 1012 ions/cm2 is required to etch through the adsorbed protein layer.
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