Dynamic Iteration for Coupled Problems of Electric Circuits and Distributed Devices

Dynamic Iteration for Coupled Problems of Electric Circuits and Distributed Devices
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电路与分布式器件耦合问题的动态迭代

DOI:
10.1137/120867111
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发表时间:
2013
期刊:
SIAM J. Sci. Comput.
影响因子:
--
通讯作者:
Schöps S.
Schöps S.
中科院分区:
--
文献类型:
--
作者:
Bartel;Günther;Schöps S.

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微分-代数耦合方程组(DAE)在动态迭代过程中可能会出现不稳定性。我们将已有的关于递归估计、误差传播和稳定性的分析推广到(半显式)指数-1 DAE。在这一背景下,我们讨论了某些耦合结构和子系统的计算顺序对收敛速度的影响。此外,我们还详细地研究了由精化电路模拟产生的两个耦合问题的收敛和发散。这些是半导体-电路和场-电路耦合。我们还使用Lipschitz常数量化了收敛速度和行为,并建议对耦合界面进行改进的建模,以改善收敛。
Coupled systems of differential-algebraic equations (DAEs) may suffer from instabilities during a dynamic iteration. We extend the existing analysis on recursion estimates, error propagation, and stability to (semiexplicit) index-1 DAEs. In this context, we discuss the influence of certain coupling structures and the computational sequence of the subsystems on the rate of convergence. Furthermore, we investigate in detail convergence and divergence for two coupled problems stemming from refined electric circuit simulation. These are the semiconductor-circuit and field-circuit couplings. We quantify the convergence rate and behavior also using Lipschitz constants and suggest an enhanced modeling of the coupling interface in order to improve convergence.
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