Lower Critical Field Measurement System of Thin Film Superconductor
Lower Critical Field Measurement System of Thin Film Superconductor
复制标题
薄膜超导体下临界场测量系统
DOI：
10.18429/jacow-ipac2018-thpal105
复制
发表时间：
2018
期刊：
影响因子：
--
通讯作者：
H. Tongu
中科院分区：
文献类型：
--
作者：
Hayato Ito;C. Antoine;A. Four;H. Hayano;R. Ito;Y. Iwashita;R. Katayama;Takayuki Kubo;T. Nagata;H. Oikawa;T. Saeki;H. Tongu
超导薄膜是提高SRF腔性能的有前途的技术。下临界场Hc1是表征超导材料的重要物理参数之一，通过在Nb上涂覆NbN等薄膜超导体，可以增强下临界场Hc1。为了研究薄膜的性能，我们利用所施加的交流磁场的三次谐波响应开发了 Hc1 测量系统。测量系统由带有两台 GM 制冷机的氦低温恒温器、样品铜台、电磁线圈铜安装座、电磁线圈、温度传感器和液氦液位计组成。交流磁场由线圈产生，线圈由函数发生器和功率放大器驱动，频率约为 1 kHz。为了控制样品台和线圈安装座的温度，附接到样品台和安装座的热锚的深度可以通过电机移动。通过这种温度控制，样品状态可以轻松地从迈斯纳状态转变为混合状态。这样对各种外加磁场重复测量，即可做出过渡曲线。在本报告中，描述了测量系统的性能。
Superconducting thin film is the promising technology to increase the performance of SRF cavities. The lower critical field Hc1, which is one of the important physical parameters characterizing a superconducting material, will be enhanced by coating Nb with thin film superconductor such as NbN. To investigate the performance of thin film, we developed the Hc1 measurement system using the third harmonic response of applied AC magnetic field. The measurement system consists of helium cryostat with two of GM refrigerators, sample Cu stage, solenoid coil Cu mount, solenoid coil, temperature sensors, and liquid helium level meter. AC magnetic field is produced by a coil which is driven by function generator and power amplifier at around 1 kHz. In order to control the temperature of the sample stage and coil mount, the depth of thermal anchors attached to the stage and the mount can be moved by the motor. By this temperature control the sample state can be easily transferred from Meissner state to mixed state. So that the measurement is repeated for various applied magnetic field, and the transition curve can be made. In this report, performance of the measurement system is described.
KEK 薄膜样品超导特性测量系统的构建
DOI：
10.18429/jacow-ipac2016-wepmb021
发表时间：
2016
期刊：
Proceedings of IPAC2016
影响因子：
--
作者：
Y. Iwashita;Y. Fuwa;M. Hino;T. Kubo;T. Saeki;岩下 芳久，頓宮 拓，不破 康裕，早野仁司， 佐伯 学行，久保 毅幸;及川 大基，東口 武史，岩下 芳久，日野 正裕，久保 毅幸，加藤 茂樹，佐伯 学行，早野 仁司;T. Saeki, H. Hayano, T. Kubo, Y. Iwashita, H. Oikawa
通讯作者：
T. Saeki, H. Hayano, T. Kubo, Y. Iwashita, H. Oikawa
DOI：
10.18429/jacow-ipac2017-mopva076
发表时间：
2017
期刊：
Proceedings of the 8th International Particle Accelerator Conference
影响因子：
--
作者：
Y. Iwashita;Y. Fuwa;H. Tongu;H. Hayano;T. Kubo;T. Saeki; M. Hino;H. Oikawa
通讯作者：
H. Oikawa