Investigation of the band alignment at MoS2/PtSe2 heterojunctions
Investigation of the band alignment at MoS2/PtSe2 heterojunctions
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MoS2/PtSe2 异质结能带排列的研究
DOI:
10.1063/1.5097248
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发表时间:
2019-05
影响因子:
4
通讯作者:
Qi Han
中科院分区:
文献类型:
--
作者:
Wang Wenjia;Li Kuilong;Wang Yang;Jiang Wenxin;Liu Xingyu;Qi Han
In this work, large-area continuous monolayer-MoS2 and triple-layer-PtSe2 films are grown on Si substrates by chemical vapor deposition and the MoS2/PtSe2 heterostructures are fabricated using transfer technology. The energy band alignment at the heterojunction is investigated by employing x-ray photoelectron spectroscopy measurements, indicating a type-I band formed at the interface. The conduction and valence band offsets are determined to be 0.85 eV and 0.66 eV, respectively, which is consistent with the results deduced from the electron affinity. Furthermore, the enhancing improvement of light absorption in the visible region implies that this heterostructure has great potential in optoelectronic applications. This study provides promising guidance for the related device design and fabrication.In this work, large-area continuous monolayer-MoS2 and triple-layer-PtSe2 films are grown on Si substrates by chemical vapor deposition and the MoS2/PtSe2 heterostructures are fabricated using transfer technology. The energy band alignment at the heterojunction is investigated by employing x-ray photoelectron spectroscopy measurements, indicating a type-I band formed at the interface. The conduction and valence band offsets are determined to be 0.85 eV and 0.66 eV, respectively, which is consistent with the results deduced from the electron affinity. Furthermore, the enhancing improvement of light absorption in the visible region implies that this heterostructure has great potential in optoelectronic applications. This study provides promising guidance for the related device design and fabrication.
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