Strong Anti-SAT: Secure and Effective Logic Locking
Strong Anti-SAT: Secure and Effective Logic Locking
复制标题
强抗SAT:安全有效的逻辑锁定
DOI:
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复制
发表时间:
2020
期刊:
影响因子:
--
通讯作者:
Ankur Srivastava
中科院分区:
文献类型:
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作者:
Yuntao Liu;Michael Zuzak;Yang Xie;Abhishek Chakraborty;Ankur Srivastava
Logic locking has been proposed as strong protection of intellectual property (IP) against security threats in the IC supply chain especially when the fabrication facility is untrusted. Such techniques use additional locking circuitry to inject incorrect behavior into the digital functionality when the key is incorrect. A family of attacks known as “SAT attacks” provides a strong mathematical formulation to find the correct key of locked circuits. Many conventional SAT-resilient logic locking schemes fail to inject sufficient error into the circuit when the key is incorrect: there are usually very few (or only one) input minterms that cause any error at the circuit output [18], [20]–[22]. The state-of-the-art stripped functionality logic locking (SFLL) [24] technique provides a wide spectrum of configurations which introduced a trade-off between security (i.e. SAT attack complexity) and effectiveness (i.e. the amount of error injected by a wrong key). In this work, we prove that such a trade-off is universal among all logic locking techniques. In order to attain high effectiveness of locking without compromising security, we propose a novel secure and effective logic locking scheme, called Strong Anti-SAT (SAS). SAS has the following significant improvements over existing techniques. (1) We prove that SAS's security against SAT attack is not compromised by increases in effectiveness. (2) In contrast to prior work which focused solely on the circuit-level locking impact, we integrate SAS-locked modules into an 80386 processor and show that SAS has a high application-level impact. (3) SAS's hardware overhead is smaller than that of existing techniques.
DOI:
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发表时间:
2019
期刊:
DAC 2019
影响因子:
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作者:
Kamali, Hadi Mardani;Zamiri Azar, Kimia;Homayoun, Houman;Sasan, Avesta
通讯作者:
Sasan, Avesta
DOI:
10.1145/3060403.3060469
发表时间:
2017-05
期刊:
Proceedings of the Great Lakes Symposium on VLSI 2017
影响因子:
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作者:
Yuanqi Shen;H. Zhou
通讯作者:
Yuanqi Shen;H. Zhou
DOI:
10.1109/tcad.2019.2944586
发表时间:
2020-10-01
影响因子:
2.9
作者:
Chakraborty, Abhishek;Jayasankaran, Nithyashankari Gummidipoondi;Zuzak, Michael
通讯作者:
Zuzak, Michael