The influence of surface processing on properties of CdZnTe films prepared by close-spaced sublimation

The influence of surface processing on properties of CdZnTe films prepared by close-spaced sublimation
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表面处理对近空间升华制备CdZnTe薄膜性能的影响

DOI:
10.1016/j.surfcoat.2018.10.043
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发表时间:
2019-01
影响因子:
5.4
通讯作者:
Lu Yicheng
Lu Yicheng
中科院分区:
材料科学1区
文献类型:
--
作者:
Yang Fan;Huang Jian;Zou Tianyu;Tang Ke;Zhang Zilong;Ma Yuncheng;Gou Saifei;Shen Yue;Wang Linjun;Lu Yicheng

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对近间隙升华法制备的多晶CdZnTe厚膜进行了机械抛光处理。采用XRD、EDS、SEM、AFM和I-V表征系统研究了al2o3抛光粉粒径(2.5 μm、1 μm和0.05 μm)和抛光时间(1 h、2 h和3 h)对CdZnTe厚膜结构、表面形貌和电学性能的影响。结果表明:减小抛光粉的粒径和适当延长抛光时间可以改善CdZnTe样品的表面粗糙度、表面缺陷和泄漏电流;
Mechanical polishing treatment was carried out on polycrystalline CdZnTe thick films grown by close-spaced sublimation method. The influence of Al2O3polishing powder particle sizes (2.5 μm, 1 μm and 0.05 μm) and polishing durations (1 h, 2 h and 3 h) on the structure, surface morphology and electrical performances of the CdZnTe thick films was studied by XRD, EDS, SEM, AFM and I-V characterization systems. The results showed that the reduction of the particle size of the polishing powder and the appropriate increase of the polishing time length could improve the surface roughness, surface defects and leakage current of the CdZnTe sample.
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