Structural distortion and enhanced ferroelectric properties of Tb and Cr co-doped BiFeO3 thin films

Structural distortion and enhanced ferroelectric properties of Tb and Cr co-doped BiFeO3 thin films
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Tb、Cr共掺杂BiFeO3薄膜的结构畸变和增强的铁电性能

DOI:
10.1007/s10854-013-1423-8
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发表时间:
2013-08
期刊:
Journal of Materials Science: Materials in Electronics
影响因子:
--
通讯作者:
Ren Huijun
Ren Huijun
中科院分区:
其他
文献类型:
--
作者:
Dong Guohua;Tan Guoqiang;Liu Wenlong;Xia Ao;Ren Huijun

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