Magnetic anisotropy in (Tb0.3Dy0.7)45Fe55 amorphous films

Magnetic anisotropy in (Tb0.3Dy0.7)45Fe55 amorphous films
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(Tb0.3Dy0.7)45Fe55非晶薄膜的磁各向异性

DOI:
10.1016/s0304-8853(01)00167-6
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发表时间:
2001-06
期刊:
Journal of Magnetism and Magnetic Materals
影响因子:
--
通讯作者:
蒋成保
蒋成保
中科院分区:
其他
文献类型:
--
作者:
徐惠彬;蒋成保

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采用直流磁控溅射法制备了超磁致伸缩(Tb0.3Dy0.7) 45fe55薄膜。通过差示扫描量热法(DSC)研究发现,薄膜的结晶起始温度为407℃。x射线衍射分析证实,薄膜在400℃退火后呈现出非晶相。研究了退火对面内各向异性的影响。当退火温度从200℃增加到400℃时,面内各向异性得到增强。在400°C退火后,Mr/ m10的比值从0.037变化到0.543,其中Mrand m10分别是在10kOe磁场下测量的剩余物和磁化强度。此外,在沉积过程中还施加了预应力,以诱导薄膜的平面内单向各向异性。这可能会导致平面内磁化的各向异性,并导致磁致伸缩的大幅改善。
Giant magnetostrictive (Tb0.3Dy0.7)45Fe55thin films were prepared by direct current (DC) magnetron sputtering. The onset temperature of crystallization of the films is found to be 407°C through differential scanning calorimetery (DSC) studies. X-ray diffraction analysis confirms that the films exhibit an amorphous phase after annealing at 400°C. The effect of annealing on the in-plane anisotropy was investigated. The in-plane anisotropy is enhanced upon increasing the annealing temperature from 200°C to 400°C. The ratio Mr/M10is varied from 0.037 for the as-deposited sample to 0.543 after annealing at 400°C, where Mrand M10refer to remanence and magnetization measured at the field of 10kOe, respectively. In addition, pre-stress was also applied during deposition to induce an in-plane unidirectional anisotropy in the films. This may result in an anisotropy of the in-plane magnetization and lead to a large improvement of magnetostriction.
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影响因子: 3.2
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