Development and Characterization of a Novel Wheat-Tetraploid Thinopyrum elongatum 6E (6D) Disomic Substitution Line with Stripe Rust Resistance at the Adult Stage.
Development and Characterization of a Novel Wheat-Tetraploid Thinopyrum elongatum 6E (6D) Disomic Substitution Line with Stripe Rust Resistance at the Adult Stage.
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DOI:
10.3390/plants12122311
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发表时间:
2023-06-14
期刊:
影响因子:
--
通讯作者:
Kang H
中科院分区:
文献类型:
--
作者:
Gong B;Zhao L;Zeng C;Zhu W;Xu L;Wu D;Cheng Y;Wang Y;Zeng J;Fan X;Sha L;Zhang H;Chen G;Zhou Y;Kang H
Stripe rust, which is caused by Puccinia striiformis f. sp. tritici, is one of the most devastating foliar diseases of common wheat worldwide. Breeding new wheat varieties with durable resistance is the most effective way of controlling the disease. Tetraploid Thinopyrum elongatum (2n = 4x = 28, EEEE) carries a variety of genes conferring resistance to multiple diseases, including stripe rust, Fusarium head blight, and powdery mildew, which makes it a valuable tertiary genetic resource for enhancing wheat cultivar improvement. Here, a novel wheat–tetraploid Th. elongatum 6E (6D) disomic substitution line (K17-1065-4) was characterized using genomic in situ hybridization and fluorescence in situ hybridization chromosome painting analyses. The evaluation of disease responses revealed that K17-1065-4 is highly resistant to stripe rust at the adult stage. By analyzing the whole-genome sequence of diploid Th. elongatum, we detected 3382 specific SSR sequences on chromosome 6E. Sixty SSR markers were developed, and thirty-three of them can accurately trace chromosome 6E of tetraploid Th. elongatum, which were linked to the disease resistance gene(s) in the wheat genetic background. The molecular marker analysis indicated that 10 markers may be used to distinguish Th. elongatum from other wheat-related species. Thus, K17-1065-4 carrying the stripe rust resistance gene(s) is a novel germplasm useful for breeding disease-resistant wheat cultivars. The molecular markers developed in this study may facilitate the mapping of the stripe rust resistance gene on chromosome 6E of tetraploid Th. elongatum.
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影响因子:
3.1
作者:
Li, HJ;Chen, O;Chu, CC
通讯作者:
Chu, CC
影响因子:
5.4
作者:
Carter, Arron Hyrum;Chen, X. M.;Kidwell, K. K.
通讯作者:
Kidwell, K. K.
DOI:
10.3390/ma11071231
发表时间:
2018-07-18
期刊:
Materials (Basel, Switzerland)
影响因子:
--
作者:
Li D;Zheng ZL;Yang R;Zhang P
通讯作者:
Zhang P
影响因子:
56.9
作者:
Fu, Daolin;Uauy, Cristobal;Dubcovsky, Jorge
通讯作者:
Dubcovsky, Jorge
影响因子:
3.3
作者:
Han, Yonghua;Zhang, Tao;Jiang, Jiming
通讯作者:
Jiang, Jiming