Enhancing secondary ion yields in time of flight-secondary ion mass spectrometry using water cluster primary beams.
Enhancing secondary ion yields in time of flight-secondary ion mass spectrometry using water cluster primary beams.
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DOI：
10.1021/ac4013732
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发表时间：
2013-06-18
影响因子：
7.4
通讯作者：
Vickerman, John C.
中科院分区：
文献类型：
--
作者：
Sheraz nee Rabbani, Sadia;Barber, Andrew;Fletcher, John S.;Lockyer, Nicholas P.;Vickerman, John C.
飞行时间二次离子质谱（TOF-SIMS）作为一种表面和材料分析技术，其二次离子产率低是制约其发展的主要因素。假设的基础上，增加密度的水相关的碎片在离子碰撞区将增强质子介导的反应，原型水团簇离子束已开发使用超音速射流膨胀方法，使离子产率使用10 keV（H2O）1000+束与使用10 keV Ar 1000+束。从四个标准化合物，精氨酸，氟哌啶醇，DPPC，和血管紧张素II的离子产率，已被测量静态+和高离子剂量条件下。对于所有化合物，已经观察到相对于氩束的10或更多数量级的离子产额增强，使得相对于氩束下的0.05，每1 μm像素的分子离子产额可以高达20。水束也已被证明部分解除氟哌啶醇和二棕榈酰磷脂酰胆碱（DPPC）的1：10混合物中的基质效应，抑制氟哌啶醇信号。这些结果提供了鼓励，进一步发展的水团簇束到更高的能量和更大的团簇尺寸将提供必要的离子产率增强的未来发展的飞行时间-二次离子质谱。
Low secondary ion yields from organic and biological molecules are the principal limitation on the future exploitation of time of flight-secondary ion mass spectrometry (TOF-SIMS) as a surface and materials analysis technique. On the basis of the hypothesis that increasing the density of water related fragments in the ion impact zone would enhance proton mediated reactions, a prototype water cluster ion beam has been developed using supersonic jet expansion methodologies that enable ion yields using a 10 keV (H2O)1000+ beam to be compared with those obtained using a 10 keV Ar1000+ beam. The ion yields from four standard compounds, arginine, haloperidol, DPPC, and angiotensin II, have been measured under static+ and high ion dose conditions. Ion yield enhancements relative to the argon beam on the order of 10 or more have been observed for all the compounds such that the molecular ion yield per a 1 μm pixel can be as high as 20, relative to 0.05 under an argon beam. The water beam has also been shown to partially lift the matrix effect in a 1:10 mixture of haloperidol and dipalmitoylphosphatidylcholine (DPPC) that suppresses the haloperidol signal. These results provide encouragement that further developments of the water cluster beam to higher energies and larger cluster sizes will provide the ion yield enhancements necessary for the future development of TOF-SIMS.
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影响因子：
1.8
作者：
Jones, Emrys A.;Lockyer, Nicholas P.;Vickerman, John C.
通讯作者：
Vickerman, John C.
DOI：
10.1002/sia.5077
发表时间：
2013-01-01
期刊：
Surface and interface analysis : SIA
影响因子：
--
作者：
Brenes DA;Postawa Z;Wucher A;Blenkinsopp P;Garrison BJ;Winograd N
通讯作者：
Winograd N
影响因子：
2
作者：
Asakawa, Daiki;Fujimaki, Susumu;Hiraoka, Kenzo
通讯作者：
Hiraoka, Kenzo
影响因子：
6.7
作者：
Jones, E. A.;Lockyer, N. P.;Vickerman, J. C.
通讯作者：
Vickerman, J. C.
影响因子：
1.7
作者：
Heile, A.;Lipinsky, D.;Arlinghaus, H. F.
通讯作者：
Arlinghaus, H. F.