Improving correlated SERS measurements with scanning electron microscopy: an assessment of the problem arising from the deposition of amorphous carbon.

Improving correlated SERS measurements with scanning electron microscopy: an assessment of the problem arising from the deposition of amorphous carbon.
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使用扫描电子显微镜改进相关 SERS 测量:对无定形碳沉积引起的问题的评估。

DOI:
10.1039/c3cp43989e
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发表时间:
2013
期刊:
Physical chemistry chemical physics : PCCP
影响因子:
--
通讯作者:
Xia,Younan
Xia,Younan
中科院分区:
--
文献类型:
--
作者:
Moran,ChristineH;Xia,Xiaohu;Xia,Younan

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对于具有非球面对称性的表面增强拉曼散射(Sers)基底,将光谱测量与扫描电子显微镜(SEM)成像相关联至关重要。然而,SEM成像期间电子束暴露导致的碳沉积会污染纳米颗粒的表面,可能会阻止它们与拉曼探针分子的进一步功能化。此外,沉积的碳导致不需要的背景Sers信号。在这项研究中,我们系统地研究了SEM成像过程中碳的沉积,并研究了它如何影响纳米粒子与探针分子的功能化,并影响Sers信号的检测。值得注意的是,我们发现碳可以通过化学或物理手段从Ag纳米颗粒表面去除或取代,使纳米颗粒具有相关的SEM/Sers研究的能力。
For surface-enhanced Raman scattering (SERS) substrates with nonspherical symmetry, it is critical to correlate spectroscopy measurements with imaging by scanning electron microscopy (SEM). However, the deposition of carbon resulting from e-beam exposure during SEM imaging contaminates the surface of nanoparticles, potentially preventing their further functionalization with Raman probe molecules. In addition, the deposited carbon leads to unwanted background SERS signals. In this study, we systematically investigated the deposition of carbon during SEM imaging and examined how it affects the functionalization of nanoparticles with probe molecules and impacts the detection of SERS signals. Significantly, we found that the carbon could be removed or replaced from the surface of Ag nanoparticles through chemical or physical means, rendering the nanoparticles the capability for correlated SEM/SERS studies.
使用扫描电子显微镜调整金属涂层纳米孔的大小。
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