Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coil at DC Current Operation
Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coil at DC Current Operation
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直流电流操作下无绝缘 REBCO 扁平线圈的匝间接触电阻测量
DOI：
10.1109/tasc.2020.2970381
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发表时间：
2020
影响因子：
1.8
通讯作者：
Kim SeokBeom
中科院分区：
文献类型：
--
作者：
Noguchi So;Tatsuta Takahiro;Nishikawa Daisuke;Ueda Hiroshi;Kim SeokBeom
无绝缘(Ni)(RE)Ba2Cu3O，(REBCO)磁体在产生强磁场的实际应用中具有很好的应用前景。NI绕组技术具有很高的热稳定性，因此不需要失超保护。然而，匝间接触电阻(有时称为特征电阻)是表征NiREBCO薄饼磁体热稳定性和充电延迟的重要因素。虽然传统的突然放电法被广泛用于测量匝间接触电阻，但它不适用于各种情况，如直流工作电流和温度的变化。因此，我们以前提出了一种利用低频交流(LFAC)电流测量匝间接触电阻的方法。为了验证LFAC方法的有效性，本文通过测量不同直流工作电流或直流电流变化时的接触电阻来验证LFAC方法的有效性。此外，通过加热测试线圈，还测量了直流工作电流变化过程中的接触电阻。由于电磁应力足够小，不会改变接触条件，所以接触电阻的变化可以忽略不计。测量的接触电阻没有变化，说明在直流工作电流作用下，用LFAC方法测量接触电阻是有效的。
No-insulation (NI) (RE)Ba2Cu3O, (REBCO) magnets are very promising for practical applications to generate high magnetic field. The NI winding technique provides high thermal stability so that quench protection is unnecessary. However, the turn-to-turn contact resistance (sometimes called characteristic resistance) is an important factor to characterize the thermal stability and charging delay of NI REBCO pancake magnets. Although the conventional sudden-discharging method is widely used to measure the turn-to-turn contact resistance, it is not applicable to various conditions; e.g., the change of DC operating current and temperature. Therefore, we have previously proposed a turn-to-turn contact resistance measurement method using a low-frequency AC (LFAC) current. In this paper, we measured the contact resistance for different DC operating currents or change of DC current to confirm the validity of LFAC method. In addition, by heating a test coil, the contact resistances were also measured during the change of DC operating current. Since the electromagnetic stress is small enough not to change the contact condition, the change in contact resistance is negligible. The measured contact resistance was unchanged, so we could conclude that the LFAC method is effective in measurement of the contact resistance when DC operating current was applied.
影响因子：
1.8
作者：
S. Noguchi;Ryousuke Miyao;Haruyoshi Okusa;Takahiro Tatsuta;H. Ueda;S. Kim
通讯作者：
S. Noguchi;Ryousuke Miyao;Haruyoshi Okusa;Takahiro Tatsuta;H. Ueda;S. Kim
利用二维有限元方法研究 NI REBCO 扁平线圈匝间电流
影响因子：
1.8
作者：
S. Noguchi;Katsutoshi Monma;H. Igarashi;A. Ishiyama
通讯作者：
A. Ishiyama
下一代高温超导回旋加速器的概念设计
影响因子：
1.8
作者：
Ueda;H、Fukuda;M、Hatanaka;K Ishiyama;A、(以下7名)
通讯作者：
A、(以下7名)