Efficient Measurement of Thermal Coupling Effects on Multichip Light-Emitting Diodes

Efficient Measurement of Thermal Coupling Effects on Multichip Light-Emitting Diodes
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多芯片发光二极管热耦合效应的有效测量

DOI:
10.1109/tpel.2017.2653193
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发表时间:
2017-01
影响因子:
6.7
通讯作者:
Chen Zhong
Chen Zhong
中科院分区:
工程技术1区
文献类型:
--
作者:
Lu Hong Li;Lu Yi Jun;Zhu Li Hong;Lin Yue;Guo Zi Quan;Liu Tong;Gao Yu Lin;Chen Guo Long;Chen Zhong

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随着基于多芯片模块的大功率LED系统的新兴市场,对先进的热管理技术的需求一直在稳步增长。本文提出了一个热耦合矩阵模型,该模型可以计算每个芯片在给定热功率下的温度分布。该模型在保持温度精度的同时,大大简化了测量对称结构多芯片发光二极管的热耦合效应的任务。利用红外热像仪和瞬态热测量系统分别对三片、四片、六片矩形模块和一个十片圆形模块进行了建模实验验证。该建模技术被发现是更有效的,特别是对大系统。该模型为预测多芯片LED系统的热耦合行为提供了一种快速的方法。
With the emerging market for multichip module based high-power LED systems, the demand for advanced thermal management techniques has been steadily growing. This paper presents a model developed by the authors for thermal coupling matrix that can calculate temperature distribution at a given heat power of each chip. The model significantly simplifies the task of measuring thermal coupling effect on multichip light-emitting diodes with symmetrical structure, while simultaneously preserving temperature accuracy. The modeling technique was validated experimentally on three-, four-, and six-chip rectangular modules, and a ten-chip circular module, by infrared thermography and transient thermal measuring system, respectively. The modeling technique was found to be more efficient especially for large systems. The model offers a rapid way to predict thermal coupling behaviors of multichip LED systems.
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发表时间: 2014-01
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