3D orientation data – A comparison of diffraction contrast tomography and serial sectioning electron backscatter diffraction for the nickel-base superalloy IN738LC
3D orientation data – A comparison of diffraction contrast tomography and serial sectioning electron backscatter diffraction for the nickel-base superalloy IN738LC
复制标题
3D 取向数据 â 镍基高温合金 IN738LC 的衍射衬度断层扫描和连续切片电子背散射衍射的比较
DOI：
10.1016/j.matlet.2019.127177
复制
发表时间：
2019
影响因子：
3
通讯作者：
Wriggers
中科院分区：
文献类型：
--
作者：
Reschka;Gerstein;Herbst;Wriggers
对于样品的表征，X射线显微镜具有多种优势，如非破坏性研究和减少样品的准备工作。取向测量可以使用衍射对比层析成像(DCT)。然而，与扫描电子显微镜结合电子背散射衍射(EBSD)相比，横向分辨率较低。通过对镍基高温合金IN738LC的三维数值模拟，比较了EBSD和DCT两种方法的优缺点和局限性。EBSD获得的图像显示了更多的微结构细节，但也显示了之前样品准备产生的人工制品。DCT似乎更适合3D成像，但不能分辨一些较小的颗粒。
For specimen characterization, X-ray microscopy offers a variety of advantages like non-destructive investigations and reduced preparation effort for the samples. Orientation measurements are possible using diffraction contrast tomography (DCT). However, lateral resolution is lower as compared to scanning electron microscopy combined with electron backscatter diffraction (EBSD). A sample of a nickel-based superalloy IN738LC was investigated three-dimensionally for direct comparison of EBSD and DCT, which clearly reveals the advantages, disadvantages and limits of both methods. Images obtained by EBSD showed more microstructural details, but also artefacts resulting from the previous sample preparation. DCT seemed more suitable for 3D-imaging, but was not able to resolve some of the smaller grains.
首个用于多晶晶粒绘图的实验室 X 射线衍射对比断层扫描
影响因子：
6.1
作者：
A. King;P. Reischig;J. Adrien;W. Ludwig
通讯作者：
W. Ludwig
影响因子：
6.1
作者：
Syha M;Trenkle A;Lödermann B;Graff A;Ludwig W;Weygand D;Gumbsch P
通讯作者：
Gumbsch P