Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation.
Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation.
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银导电聚合物混合薄膜的原子力显微镜研究:光诱导电荷分离的证据
DOI:
10.3390/nano10091819
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发表时间:
2020-09-12
期刊:
影响因子:
--
通讯作者:
Zhang Y
中科院分区:
文献类型:
--
作者:
Wu Y;Wang D;Liu J;Cai H;Zhang Y
Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4H-cyclopenta[2,1-b;3,4-bʹ]dithiophene)-alt-4,7-(2,1,3-benzothiadiazole)] (PCPDTBT) and poly(3-hexylthiophene-2,5-diyl) (P3HT). They are also widely used in order to directly observe the charge distribution and dynamic changes at the interfaces in nanostructures, owing to their high sensitivity. Using SKPM, it is proved that the charge of the photo-induced polymer PCPDTBT is transferred to Ag nanoparticles (NPs). The surface charge of the Ag-induced NPs is quantified while using EFM, and it is determined that the charge is injected into the polymer P3HT from the Ag NPs. We expect that this technology will provide guidance to facilitate the separation and transfer of the interfacial charges in the composite material systems and it will be applicable to various photovoltaic material systems.
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DOI:
10.3390/nano8090681
发表时间:
2018-08-31
期刊:
Nanomaterials (Basel, Switzerland)
影响因子:
--
作者:
Burdușel AC;Gherasim O;Grumezescu AM;Mogoantă L;Ficai A;Andronescu E
通讯作者:
Andronescu E
影响因子:
29.4
作者:
Fischer, Florian S. U.;Trefz, Daniel;Ludwigs, Sabine
通讯作者:
Ludwigs, Sabine
影响因子:
2.3
作者:
Kacus, H.;Aydogan, S.;Sevim, M.
通讯作者:
Sevim, M.
影响因子:
10.8
作者:
Lu, Luyao;Luo, Zhiqiang;Yu, Luping
通讯作者:
Yu, Luping
影响因子:
9.9
作者:
Sondi, I;Salopek-Sondi, B
通讯作者:
Salopek-Sondi, B