Yeast endocytic adaptor AP-2 binds the stress sensor Mid2 and functions in polarized cell responses.
Yeast endocytic adaptor AP-2 binds the stress sensor Mid2 and functions in polarized cell responses.
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DOI:
10.1111/tra.12155
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发表时间:
2014-05
期刊:
影响因子:
--
通讯作者:
Ayscough KR
中科院分区:
文献类型:
--
作者:
Chapa-y-Lazo B;Allwood EG;Smaczynska-de Rooij II;Snape ML;Ayscough KR
The AP-2 complex is a heterotetrameric endocytic cargo-binding adaptor that facilitates uptake of membrane proteins during mammalian clathrin-mediated endocytosis. While budding yeast has clear homologues of all four AP-2 subunits which form a complex and localize to endocytic sites in vivo, the function of yeast AP-2 has remained enigmatic. Here, we demonstrate that AP-2 is required for hyphal growth in Candida albicans and polarized cell responses in Saccharomyces cerevisiae. Deletion of APM4, the cargo-binding mu subunit of AP-2, causes defects in pseudohyphal growth, generation of a mating projection and the cell wall damage response. In an apm4 null mutant, the cell wall stress sensor Mid2 is unable to relocalize to the tip of a mating projection following pheromone addition, or to the mother bud neck in response to cell wall damage. A direct binding interaction between Mid2 and the mu homology domain of Apm4 further supports a model in which AP-2 binds Mid2 to facilitate its internalization and relocalization in response to specific signals. Thus, Mid2 is the first cargo for AP-2 identified in yeast. We propose that endocytic recycling of Mid2 and other components is required for polarized cell responses ensuring cell wall deposition and is tightly monitored during cell growth.
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DOI:
10.1083/jcb.201206081
发表时间:
2013-02-18
期刊:
The Journal of cell biology
影响因子:
--
作者:
Jose M;Tollis S;Nair D;Sibarita JB;McCusker D
通讯作者:
McCusker D
影响因子:
4
作者:
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Gray, Joseph V.
DOI:
10.1083/jcb.135.2.341
发表时间:
1996-10
期刊:
The Journal of cell biology
影响因子:
--
作者:
Marks MS;Woodruff L;Ohno H;Bonifacino JS
通讯作者:
Bonifacino JS
影响因子:
64.8
作者:
Kelly, Bernard T.;McCoy, Airlie J.;Spaete, Kira;Miller, Sharon E.;Evans, Philip R.;Hoening, Stefan;Owen, David J.
通讯作者:
Owen, David J.
影响因子:
16
作者:
Nern, A;Arkowitz, RA
通讯作者:
Arkowitz, RA