Mixed-Dimensional 1D/2D van der Waals Heterojunction Diodes and Transistors in the Atomic Limit.
Mixed-Dimensional 1D/2D van der Waals Heterojunction Diodes and Transistors in the Atomic Limit.
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DOI:
10.1021/acsnano.1c10524
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发表时间:
2022-01-25
期刊:
影响因子:
17.1
通讯作者:
Shepard, Kenneth L.
中科院分区:
文献类型:
--
作者:
Jadwiszczak, Jakub;Sherman, Jeffrey;Lynall, David;Liu, Yang;Penkov, Boyan;Young, Erik;Keneipp, Rachael;Drndic, Marija;Hone, James C.;Shepard, Kenneth L.
关键词:
Inverting a semiconducting channel is the basis of all field-effect transistors. In silicon-based metal-oxide-semiconductor field-effect transistors (MOSFETs), a gate dielectric mediates this inversion. Access to inversion layers may be granted by interfacing ultrathin low-dimensional semiconductors in heterojunctions to advance device down-scaling. Here we demonstrate that monolayer molybdenum disulfide (MoS2) can directly invert a single-walled semiconducting carbon nanotube (SWCNT) transistor channel without the need for a gate dielectric. We fabricate and study this atomically thin one-dimensional/two-dimensional (1D/2D) van der Waals heterojunction and employ it as the gate of a 1D heterojunction field-effect transistor (1D-HFET) channel. Gate control is based on modulating the conductance through the channel by forming a lateral p–n junction within the CNT itself. In addition, we observe a region of operation exhibiting a negative static resistance after significant gate tunneling current passes through the junction. Technology computer-aided design (TCAD) simulations confirm the role of minority carrier drift-diffusion in enabling this behavior. The resulting van der Waals transistor architecture thus has the dual characteristics of both field-effect and tunneling transistors, and it advances the downscaling of heterostructures beyond the limits of dangling bonds and epitaxial constraints faced by III–V semiconductors.
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影响因子:
3.1
作者:
DELAGEBEAUDEUF, D;LINH, NT
通讯作者:
LINH, NT
影响因子:
17.1
作者:
Doan, Manh-Ha;Jin, Youngjo;Lee, Young Hee
通讯作者:
Lee, Young Hee
影响因子:
34.3
作者:
Lee, Donghun;Lee, Jea Jung;Lee, Chul-Ho
通讯作者:
Lee, Chul-Ho
影响因子:
3.3
作者:
Huang, Limin;White, Brian;O'Brien, Stephen
通讯作者:
O'Brien, Stephen
DOI:
10.1002/pssa.2210060217
发表时间:
1971-01-01
期刊:
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
影响因子:
--
作者:
DEMOULIN, E;VANDEWIE.F
通讯作者:
VANDEWIE.F