Laboratory-based x-ray dark-field microscopy
Laboratory-based x-ray dark-field microscopy
复制标题
基于实验室的 X 射线暗视野显微镜
DOI:
10.1103/physrevapplied.20.064039
复制
发表时间:
2023
影响因子:
4.6
通讯作者:
Esposito M
中科院分区:
文献类型:
--
作者:
Esposito M
We demonstrate the capability of laboratory-based x-ray microscopes, using intensity-modulation masks, to access the submicron length scale in the dark-field contrast channel while maintaining micron resolution in the resolved (refraction and attenuation) channels. The dark-field contrast channel reveals the presence of ensembles of samples’ features below the system resolution. Resolved refraction and attenuation channels provide multimodal high-resolution imaging down to the micron scale. We investigate the regimes of modulated and unmodulated dark field as well as refraction, quantifying their dependence on the relationship between feature size in the imaged object and aperture size in the intensity-modulation mask. We propose an analytical model to link the measured signal with the sample’s microscopic properties. Finally, we demonstrate the relevance of the microscopic dark-field contrast channel in applications from both the life and physical sciences, providing proof-of-concept results for imaging collagen bundles in cartilage and dendritic growth in lithium batteries.
登录
查看更多内容
影响因子:
3.5
作者:
Gureyev, T. E.;Paganin, D. M.;Quiney, H. M.
通讯作者:
Quiney, H. M.
影响因子:
4
作者:
Endrizzi, Marco;Diemoz, Paul C.;Olivo, Alessandro
通讯作者:
Olivo, Alessandro
影响因子:
3.5
作者:
Wernick, MN;Wirjadi, O;Muehleman, C
通讯作者:
Muehleman, C
影响因子:
4.6
作者:
Morgan, Kaye S.;Paganin, David M.
通讯作者:
Paganin, David M.
影响因子:
4.6
作者:
How, Ying Ying;Paganin, David M.;Morgan, Kaye S.
通讯作者:
Morgan, Kaye S.