Superconducting Quantum Interference in Twisted van der Waals Heterostructures.

Superconducting Quantum Interference in Twisted van der Waals Heterostructures.
复制标题

DOI:
10.1021/acs.nanolett.1c00152
复制
发表时间:
2021-08-25
期刊:
影响因子:
10.8
通讯作者:
Bending SJ
Bending SJ
中科院分区:
材料科学1区
文献类型:
--
作者:
Farrar LS;Nevill A;Lim ZJ;Balakrishnan G;Dale S;Bending SJ

文献摘要

参考文献

被引文献

相似文献

我们证明了约瑟夫森结和超导量子干涉器件(SQUID)的形成,使用干转移技术堆叠和确定性错位机械剥离片的NbSe 2。所得到的扭曲NbSe 2-NbSe 2结的电流-电压特性被发现是敏感的晶轴的错位角,开辟了一个新的控制参数,用于优化器件的性能,这是不可用于薄膜沉积结。一个单一的光刻工艺,然后实施到SQUID几何形状的约瑟夫森结与典型的环路面积为125 μm2和弱链接1600 nm宽。在T = 3.75 K的外加磁场中,这些器件显示出大的稳定电流和电压调制深度,分别高达ΔIc <$75%和ΔV <$1.4 mV。
We demonstrate the formation of both Josephson junctions and superconducting quantum interference devices (SQUIDs) using a dry transfer technique to stack and deterministically misalign mechanically exfoliated flakes of NbSe2. The current–voltage characteristics of the resulting twisted NbSe2–NbSe2 junctions are found to be sensitive to the misalignment angle of the crystallographic axes, opening up a new control parameter for optimization of the device performance, which is not available in thin-film-deposited junctions. A single lithographic process has then been implemented to shape Josephson junctions into SQUID geometries with typical loop areas of ∼25 μm2 and weak links ∼600 nm wide. At T = 3.75 K in an applied magnetic field, these devices display large stable current and voltage modulation depths of up to ΔIc ∼ 75% and ΔV ∼ 1.4 mV, respectively.
DOI: 10.1143/jpsj.51.219
发表时间: 1982-01-01
影响因子: 1.7
作者:
NAITO, M;TANAKA, S
通讯作者: TANAKA, S
DOI: 10.1103/physrevlett.109.186807
发表时间: 2012-11-02
影响因子: 8.6
作者:
Ohta, Taisuke;Robinson, Jeremy T.;Beechem, Thomas E.
通讯作者: Beechem, Thomas E.
DOI: 10.1021/acs.nanolett.6b00609
发表时间: 2016-07-01
期刊: NANO LETTERS
影响因子: 10.8
作者:
Pierucci, Debora;Henck, Hugo;Ouerghi, Abdelkarim
通讯作者: Ouerghi, Abdelkarim
DOI: 10.1088/2053-1583/1/1/011002
发表时间: 2014-06-01
期刊: 2D MATERIALS
影响因子: 5.5
作者:
Castellanos-Gomez, Andres;Buscema, Michele;Steele, Gary A.
通讯作者: Steele, Gary A.
DOI: 10.1103/physrevb.69.184509
发表时间: 2004-05-01
期刊: PHYSICAL REVIEW B
影响因子: 3.7
作者:
Brandt, EH;Clem, JR
通讯作者: Clem, JR