Impact of Rotation Rate on Bismuth Saturation in GaAsBi Grown by Molecular Beam Epitaxy
Impact of Rotation Rate on Bismuth Saturation in GaAsBi Grown by Molecular Beam Epitaxy
复制标题
旋转速率对分子束外延生长的 GaAsBi 中铋饱和度的影响
DOI:
10.1007/s11664-019-06949-6
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发表时间:
2019
影响因子:
2.1
通讯作者:
Vandervelde, Thomas E.
中科院分区:
文献类型:
--
作者:
Stevens, Margaret A.;Grossklaus, Kevin A.;McElearney, John H.;Vandervelde, Thomas E.
GaAs1−xBixhas been grown by solid-source molecular beam epitaxy using varying substrate rotation rates. Changes in local bismuth saturation were studied by varying the Bi/Ga pressure ratio across the wafer. Films were grown on both GaAs and InGaAs buffer layers with varying indium content to change the strain conditions of the bismide layer and the out-of-plane growth rate. All samples demonstrated vertical composition modulations with a period of ∼ 4 nm that tracked with the rate of growth per substrate rotation cycle. The thermal stability of these composition modulations was shown to behave similarly to bulk GaAsBi. Bismide composition modulations are attributed to the low growth temperature and the varying Bi/Ga pressure ratio across the sample rather than the varying V/III ratio.
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