Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS(2) transistor.
Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS(2) transistor.
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隧道接触原子薄MoS2晶体管中的栅控可逆整流行为
DOI:
10.1038/s41467-017-01128-9
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发表时间:
2017-10-17
影响因子:
16.6
通讯作者:
Zhang ZD
中科院分区:
文献类型:
--
作者:
Li XX;Fan ZQ;Liu PZ;Chen ML;Liu X;Jia CK;Sun DM;Jiang XW;Han Z;Bouchiat V;Guo JJ;Chen JH;Zhang ZD
Atomically thin two-dimensional semiconducting materials integrated into van der Waals heterostructures have enabled architectures that hold great promise for next generation nanoelectronics. However, challenges still remain to enable their applications as compliant materials for integration in logic devices. Here, we devise a reverted stacking technique to intercalate a wrinkle-free boron nitride tunnel layer between MoS2 channel and source drain electrodes. Vertical tunnelling of electrons therefore makes it possible to suppress the Schottky barriers and Fermi level pinning, leading to homogeneous gate-control of the channel chemical potential across the bandgap edges. The observed features of ambipolar pn to np diode, which can be reversibly gate tuned, paves the way for future logic applications and high performance switches based on atomically thin semiconducting channel.
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影响因子:
19.6
作者:
Feldman, Benjamin E.;Randeria, Mallika T.;Yazdani, Ali
通讯作者:
Yazdani, Ali
影响因子:
3.7
作者:
Brandbyge, M;Mozos, JL;Stokbro, K
通讯作者:
Stokbro, K
影响因子:
4
作者:
Lee, Gwan-Hyoung;Yu, Young-Jun;Hone, James
通讯作者:
Hone, James
影响因子:
38.3
作者:
Dean, C. R.;Young, A. F.;Hone, J.
通讯作者:
Hone, J.
影响因子:
38.3
作者:
Mishchenko, A.;Tu, J. S.;Novoselov, K. S.
通讯作者:
Novoselov, K. S.