Optical constants of restored and etched reduced graphene oxide: a spectroscopic ellipsometry study
Optical constants of restored and etched reduced graphene oxide: a spectroscopic ellipsometry study
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还原和蚀刻还原氧化石墨烯的光学常数：光谱椭圆光度研究
DOI：
10.1364/ome.9.000234
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发表时间：
2018
影响因子：
2.8
通讯作者：
Wei Wei
中科院分区：
文献类型：
--
作者：
Yuhong Cao;Ertao Hu;Jie Xing;Li Liu;Tong Gu;Jiajin Zheng;Kehan Yu;Wei Wei
石墨烯的结构和缺陷信息通常通过拉曼光谱和电学技术来检测；然而，对石墨烯的椭偏光谱研究却很少有人关注。本文采用椭偏光谱法对化学气相沉积(G)、还原氧化石墨烯（RGO）、还原氧化石墨烯和蚀刻氧化石墨烯的光学响应进行了表征。采用洛伦兹振子模型拟合椭偏参数。得到的光学常数、折射率和消光系数在缺陷较少的石墨烯（即G和还原RGO）中更高。结果可以与拉曼光谱观测相关联-更少的缺陷导致更高的密度和更多的光吸收。我们的研究为探索缺陷石墨烯的结构信息开辟了一个新的视角，从而有利于高质量石墨烯的生产。
Structural and defective information in graphene are usually detected by Raman spectroscopy and electrical techniques; however, less attention has been paid to a spectroscopic ellipsometry investigation on graphene. Here, optical responses of graphene grown by chemical vapor deposition (G), reduced graphene oxide (RGO), restored RGO, and etched RGO are characterized by spectroscopic ellipsometry. The Lorentz oscillator model is used to fit the ellipsometric parameters. The resulting optical constants, refractive index and extinction coefficient are higher in less defective graphene, i.e. G and restored RGO. The results can be correlated with the Raman spectroscopic observation – fewer defects leading to higher density and more optical absorption. Our investigation opens a new angle of view to probe the structural information in the defective graphene and thus favors the production of high-quality graphene.
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影响因子：
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作者：
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通讯作者：
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作者：
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