Silicon acoustoelectronics with thin film lithium niobate

Silicon acoustoelectronics with thin film lithium niobate
复制标题

薄膜铌酸锂硅声电子学

DOI:
--
复制
发表时间:
2018
期刊:
Journal of Physics D: Applied Physics
影响因子:
--
通讯作者:
D. Weinstein
D. Weinstein
中科院分区:
--
文献类型:
--
作者:
U. Bhaskar;S. Bhave;D. Weinstein

文献摘要

参考文献

被引文献

相似文献

本文报道了在标准电阻率和高阻硅衬底(LNOSs)上异质集成的锂离子薄膜中的声电相互作用。单片LNOS平台提供具有大机电耦合系数(K2)的声波,并利用标准金属氧化物半导体场效应技术,通过将声波与半导体载流子阻抗匹配来最大化AE相互作用。获得了AE衰减(4 dB cm−1)和AE增益(6 dB cm−1)的初步结果。随着LN/Si界面的进一步改善,可以预期LNOS平台将带来非互易硅声电子学的时代。
We report on the acoustoelectric (AE) interaction in heterogeneously integrated thin-film lithium niobate on standard resistivity and high resistivity silicon substrates (LNOSs). The monolithic LNOS platform delivers acoustic waves with a large electromechanical coupling coefficient (K2) and draws on standard metal-oxide semiconductor field effect techniques to maximise AE interaction by impedance matching the acoustic wave with the semiconductor carriers. Preliminary results are obtained on AE attenuation (4 dB cm−1) and AE gain (6 dB cm−1). With further improvement of the LN/Si interface, the LNOS platform can be expected to give rise to an era of non-reciprocal silicon acoustoelectronics.
DOI: 10.1038/ncomms9593
发表时间: 2015-10-23
影响因子: 16.6
作者:
Preciado E;Schülein FJR;Nguyen AE;Barroso D;Isarraraz M;von Son G;Lu IH;Michailow W;Möller B;Klee V;Mann J;Wixforth A;Bartels L;Krenner HJ
通讯作者: Krenner HJ
DOI: 10.1063/1.4898704
发表时间: 2014-10-13
影响因子: 4
作者:
Betz, A. C.;Gonzalez-Zalba, M. F.;Ferguson, A. J.
通讯作者: Ferguson, A. J.