Ablation threshold and crater morphology of amorphous and crystalline SiO2 glass for extreme ultraviolet femtosecond pulses
Ablation threshold and crater morphology of amorphous and crystalline SiO2 glass for extreme ultraviolet femtosecond pulses
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极紫外飞秒脉冲非晶态和晶态 SiO2 玻璃的烧蚀阈值和火山口形貌
DOI:
10.35848/1347-4065/abc85a
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发表时间:
2020
影响因子:
1.5
通讯作者:
Kuroda R.
中科院分区:
文献类型:
--
作者:
Shibuya T.;Sakaue K.;Ogawa H.;Dinh T.-H.;Satoh D.;Terasawa E.;Washio M.;Tanaka M.;Higashiguchi T.;Ishino M.;Kubota Y.;Inubushi Y.;Owada S.;Nishikino M.;Kobayashi Y.;Kuroda R.
影响因子:
4
作者:
J. Chalupský;V. Hájková;V. Altapova;T. Burian;A. Gleeson;L. Juha;M. Jurek;H. Sinn;M. Störmer;R. Sobierajski;K. Tiedtke;S. Toleikis;T. Tschentscher;L. Vyšín;H. Wabnitz;J. Gaudin
通讯作者:
J. Chalupský;V. Hájková;V. Altapova;T. Burian;A. Gleeson;L. Juha;M. Jurek;H. Sinn;M. Störmer;R. Sobierajski;K. Tiedtke;S. Toleikis;T. Tschentscher;L. Vyšín;H. Wabnitz;J. Gaudin
影响因子:
3.6
作者:
T. Mocek;B. Rus;M. Kozlová;J. Polan;P. Homer;L. Juha;V. Hájková;J. Chalupský
通讯作者:
J. Chalupský
影响因子:
2.5
作者:
Owada S;Togawa K;Inagaki T;Hara T;Tanaka T;Joti Y;Koyama T;Nakajima K;Ohashi H;Senba Y;Togashi T;Tono K;Yamaga M;Yumoto H;Yabashi M;Tanaka H;Ishikawa T
通讯作者:
Ishikawa T